Interface Circuits for TIA/EIA-644 (LVDS) (Rev. B)
This design note provides information concerning the designing of TIA/EIA-644 interface circuits. The TIA/EIA-644 standard is discussed including electrical characteristics, interconnections, line termination, and noise immunity. Finally, eye patterns are used to measure the effects of signal distortion, noise, signal attenuation, and the resultant intersymbol interference (ISI) in a data transmission system.