Describes the known exceptions to the functional specifications for the MSP430F5229 device.

Describes the known exceptions to the functional specifications for the MSP430F5227 device.

Describes the known exceptions to the functional specifications for the MSP430F5224 device.

Describes the known exceptions to the functional specifications for the MSP430F5222 device.

Describes the known exceptions to the functional specifications for the MSP430F5219 device.

Describes the known exceptions to the functional specifications for the MSP430F5217 device.

Describes the known exceptions to the functional specifications for the MSP430F5214 device.

Describes the known exceptions to the functional specifications for the MSP430F5212 device.

Detailed information on the modules and peripherals available in this device family.

The MSP430 bootloader (BSL) (formerly known as the bootstrap loader) lets users communicate with embedded memory in the MSP430 microcontroller during the prototyping phase, final production, and in service. Both the programmable memory (flash memory) and the data memory (RAM) can be modified as required. Do not confuse the bootloader with the bootstrap loader programs found in some digital signal processors (DSPs) that automatically load program code (and data) from external memory to the internal memory of the DSP.

This document describes the functions that are required to erase, program, and verify the memory module of the MSP430 flash-based and FRAM-based microcontroller families using the JTAG communication port. In addition, it describes how to program the JTAG access security fuse that is available on all MSP430 devices. This document describes device access using both the standard 4-wire JTAG interface and the 2-wire JTAG interface, which is also referred to as Spy-Bi-Wire (SBW).

This manual describes the hardware of the TI MSP-FET430 Flash Emulation Tool (FET). The FET is the program development tool for the MSP430 ultra-low-power microcontroller.

The MSP430F522x and MSP430F521x devices support a split supply I/O system that is essential in systems in which the MCU is required to interface with external devices (such as sensors or other processors) that operate at different voltage level compared to the MCU device supply. Additionally, the split supply input voltage range of the F522x and F521x devices starts as low as 1.62 V (see the device data sheet specifications), and this allows for nominal 1.8-V I/O interface without the need for external level translation. This application report describes the various design considerations to keep in mind while designing the F522x and F521x devices in an application.

Multiple MSP ultra-low-power microcontrollers offer analog-to-digital converters (ADCs) to convert physical quantities into digital numbers, a function that is widely used across numerous applications. There are times, however, when a customer design demands a higher resolution than the ADC of the selected MSP can offer. This application report, which is based on the previously-published Oversampling the ADC12 for Higher Resolution (SLAA323), therefore describes how an oversampling method can be incorporated to increase ADC resolution past the currently available number of bits.

Selection of the correct crystal, correct load circuit, and proper board layout are important for a stable crystal oscillator. This application report summarizes crystal oscillator function and explains the parameters to select the correct crystal for MSP430 ultra-low-power operation. In addition, hints and examples for correct board layout are given. The document also contains detailed information on the possible oscillator tests to ensure stable oscillator operation in mass production.

System-Level ESD has become increasingly demanding as silicon technology scales to lower voltages and the need for designing cost-effective and ultra-low-power components. This application report addresses three ESD topics to help board designers and OEMs understand and design robust system-level designs: (1) Component-level ESD testing and system-level ESD testing; (2) General design guidelines for system-level ESD protection; (3) Introduction to System Efficient ESD Design (SEED), a co-design methodology of on-board and on-chip ESD protection. A few real-world system-level ESD protection design examples and their results are discussed.