SNAA390 july   2023 LMK6C , LMK6D , LMK6H , LMK6P

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Test Standards and Test Setup
    1. 2.1 Test Standards
    2. 2.2 Test Setup in Vibration Lab
  6. 3Sinusoidal Vibration, Random Vibration, and Mechanical Shock Tests
    1. 3.1 Sinusoidal Vibration Test
      1. 3.1.1 Procedure for Sinusoidal Vibration Test
      2. 3.1.2 Results From Sinusoidal Vibration Test
    2. 3.2 Random Vibration Test
      1. 3.2.1 Procedure for Random Vibration Test
      2. 3.2.2 Results From Random Vibration Test
    3. 3.3 Mechanical Shock Test
      1. 3.3.1 Procedure for Mechanical Shock Test
      2. 3.3.2 Results From Mechanical Shock Test
  7. 4Comparison of BAW Oscillator Vibration Performance With Crystal Oscillator
    1. 4.1 Comparison Test Setup
    2. 4.2 Comparison Test Results
  8. 5Summary
  9. 6References

3.2.2 Results From Random Vibration Test

The plots shown in this section are captured before, during, and after the random vibration test, which are tested following the MIL-STD-883F method 2026C.

The capture data for the Z-axis movement of the DLE 4-pin (LVCMOS) oscillator is shown in Figure 3-15 and Figure 3-16.

GUID-20230626-SS0I-XP77-BK7X-XMWV90KCSGBP-low.pngFigure 3-15 Plot of Before and After Vibration Test on 4-pin DLE (LVCMOS)
GUID-20230706-SS0I-PVGL-6JJG-DSGX26SVMJC2-low.pngFigure 3-16 Capture During Vibration of the 4-pin DLE (LVCMOS)

The capture data for the Z-axis movement of the DLE 6-pin (LVPECL) oscillator is shown in Figure 3-17 and Figure 3-18.

GUID-20230626-SS0I-0GZN-7XNC-RX08CMZJHKHT-low.pngFigure 3-17 Plot of Before and After Vibration Test on 6-pin DLE (LVPECL)
GUID-20230706-SS0I-XJWQ-VLXK-2KNZHCL2FXXG-low.pngFigure 3-18 Capture During Vibration Test on 6-pin DLE (LVPECL)

The preceding plots show that the performance of the BAW Oscillator is robust during and after the vibration and the jitter performance is not degraded.