Design Support


This application report discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns can be loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705, and LMK04806B.