DLPS048C March   2015  – June 2019 DLPC150

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      DLP 0.2-Inch WVGA Chipset
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
    2. 5.1 DLPC150 Mechanical Data
      1. Table 1. I/O Type Subscript Definition
      2. Table 2. Internal Pullup and Pulldown Characteristics
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics Over Recommended Operating Conditions
    6. 6.6  Electrical Characteristics
    7. 6.7  High-Speed Sub-LVDS Electrical Characteristics
    8. 6.8  Low-Speed SDR Electrical Characteristics
    9. 6.9  System Oscillators Timing Requirements
    10. 6.10 Power-Up and Reset Timing Requirements
    11. 6.11 Parallel Interface Frame Timing Requirements
    12. 6.12 Parallel Interface General Timing Requirements
    13. 6.13 Flash Interface Timing Requirements
  7. 7 Parameter Measurement Information
    1. 7.1 Host_irq Usage Model
    2. 7.2 Input Source
      1. 7.2.1 Parallel Interface Supports Two Data Transfer Formats
        1. 7.2.1.1 Pdata Bus – Parallel Interface Bit Mapping Modes
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Interface Timing Requirements
        1. 8.3.1.1 Parallel Interface
      2. 8.3.2 Serial Flash Interface
      3. 8.3.3 Serial Flash Programming
      4. 8.3.4 I2C Control Interface
      5. 8.3.5 DMD (Sub-LVDS) Interface
      6. 8.3.6 Calibration And Debug Support
      7. 8.3.7 DMD Interface Considerations
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 DLPC150 System Design Consideration – Application Notes
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 DLPC150 System Interfaces
          1. 9.2.2.1.1 Control Interface
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 System Power-Up and Power-Down Sequence
    2. 10.2 DLPC150 Power-Up Initialization Sequence
    3. 10.3 DMD Fast Park Control (PARKZ)
    4. 10.4 Hot Plug Usage
    5. 10.5 Maximum Signal Transition Time
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 PCB Layout Guidelines For Internal Controller PLL Power
      2. 11.1.2 DLPC150 Reference Clock
        1. 11.1.2.1 Recommended Crystal Oscillator Configuration
      3. 11.1.3 General PCB Recommendations
      4. 11.1.4 General Handling Guidelines for Unused CMOS-Type Pins
      5. 11.1.5 Maximum Pin-to-Pin, PCB Interconnects Etch Lengths
      6. 11.1.6 Number of Layer Changes
      7. 11.1.7 Stubs
      8. 11.1.8 Terminations
      9. 11.1.9 Routing Vias
    2. 11.2 Layout Example
    3. 11.3 Thermal Considerations
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
        1. 12.1.1.1 Device Markings
    2. 12.2 Related Links
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information
    1. 13.1 Package Option Addendum
      1. 13.1.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)

8.3.6 Calibration And Debug Support

The DLPC150 contains a test point output port, TSTPT_(7:0), which provides selected system calibration support as well as controller debug support. These test points are inputs while reset is applied and switch to outputs when reset is released. The state of these signals is sampled upon the release of system reset and the captured value configures the test mode until the next time reset is applied. Each test point includes an internal pulldown resistor, thus external pullups must be used to modify the default test configuration. The default configuration (x000) corresponds to the TSTPT_(7:0) outputs remaining tri-stated to reduce switching activity during normal operation. For maximum flexibility, an option to jumper to an external pullup is recommended for TSTPT_(2:0). Pullups on TSTPT_(6:3) are used to configure the controller for a specific mode or option. TI does not recommend adding pullups to TSTPT_(7:3) because this has adverse affects for normal operation. This external pullup is only sampled upon a 0-to-1 transition on the RESETZ input, thus changing their configuration after reset is released will not have any effect until the next time reset is asserted and released. Table 10 defines the test mode selection for one programmable scenario defined by TSTPT(2:0).

Table 10. Test Mode Selection Scenario Defined By Tstpt(2:0)(1)

TSTPT(2:0) CAPTURE VALUE NO SWITCHING ACTIVITY CLOCK DEBUG OUTPUT
x000 x010
TSTPT(0) HI-Z 60 MHz
TSTPT(1) HI-Z 30 MHz
TSTPT(2) HI-Z 0.7 to 22.5MHz
TSTPT(3) HI-Z HIGH
TSTPT(4) HI-Z LOW
TSTPT(5) HI-Z HIGH
TSTPT(6) HI-Z HIGH
TSTPT(7) HI-Z 7.5 MHz
(1) These are only the default output selections. Software can reprogram the selection at any time.