SBOS445C July  2008  – December 2015 INA333

PRODUCTION DATA. 

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1Absolute Maximum Ratings
    2. 6.2ESD Ratings
    3. 6.3Recommended Operating Conditions
    4. 6.4Thermal Information
    5. 6.5Electrical Characteristics
    6. 6.6Typical Characteristics
  7. Detailed Description
    1. 7.1Overview
    2. 7.2Functional Block Diagram
    3. 7.3Feature Description
    4. 7.4Device Functional Modes
      1. 7.4.1Internal Offset Correction
      2. 7.4.2Input Common-Mode Range
  8. Application and Implementation
    1. 8.1Application Information
    2. 8.2Typical Application
      1. 8.2.1Design Requirements
      2. 8.2.2Detailed Design Procedure
        1. 8.2.2.1 Setting the Gain
        2. 8.2.2.2 Internal Offset Correction
        3. 8.2.2.3 Offset Trimming
        4. 8.2.2.4 Noise Performance
        5. 8.2.2.5 Input Bias Current Return Path
        6. 8.2.2.6 Input Common-Mode Range
        7. 8.2.2.7 Operating Voltage
        8. 8.2.2.8 Low Voltage Operation
        9. 8.2.2.9 Single-Supply Operation
        10. 8.2.2.10Input Protection
      3. 8.2.3Application Curves
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1Layout Guidelines
    2. 10.2Layout Example
  11. 11Device and Documentation Support
    1. 11.1Device Support
      1. 11.1.1Development Support
        1. 11.1.1.1TINA-TI (Free Download Software)
    2. 11.2Documentation Support
      1. 11.2.1Related Documentation
    3. 11.3Trademarks
    4. 11.4Electrostatic Discharge Caution
    5. 11.5Glossary
  12. 12Mechanical, Packaging, and Orderable Information

10 Layout

10.1 Layout Guidelines

Attention to good layout practices is always recommended. Keep traces short and, when possible, use a printed-circuit-board (PCB) ground plane with surface-mount components placed as close to the device pins as possible. Place a 0.1-μF bypass capacitor closely across the supply pins. These guidelines should be applied throughout the analog circuit to improve performance and provide benefits such as reducing the electromagnetic-interference (EMI) susceptibility.

Instrumentation amplifiers vary in the susceptibility to radio-frequency interference (RFI). RFI can generally be identified as a variation in offset voltage or DC signal levels with changes in the interfering RF signal. The INA333 device has been specifically designed to minimize susceptibility to RFI by incorporating passive RC filters with an 8-MHz corner frequency at the VIN+ and VIN– inputs. As a result, the INA333 device demonstrates remarkably low sensitivity compared to previous generation devices. Strong RF fields may continue to cause varying offset levels, however, and may require additional shielding.

10.2 Layout Example

INA333 Layouts.gif Figure 40. INA333 Layout