SNIS159G August 1999  – August 2016 LM35

PRODUCTION DATA. 

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1Absolute Maximum Ratings
    2. 6.2ESD Ratings
    3. 6.3Recommended Operating Conditions
    4. 6.4Thermal Information
    5. 6.5Electrical Characteristics: LM35A, LM35CA Limits
    6. 6.6Electrical Characteristics: LM35A, LM35CA
    7. 6.7Electrical Characteristics: LM35, LM35C, LM35D Limits
    8. 6.8Electrical Characteristics: LM35, LM35C, LM35D
    9. 6.9Typical Characteristics
  7. Detailed Description
    1. 7.1Overview
    2. 7.2Functional Block Diagram
    3. 7.3Feature Description
      1. 7.3.1LM35 Transfer Function
    4. 7.4Device Functional Modes
  8. Application and Implementation
    1. 8.1Application Information
      1. 8.1.1Capacitive Drive Capability
    2. 8.2Typical Application
      1. 8.2.1Basic Centigrade Temperature Sensor
        1. 8.2.1.1Design Requirements
        2. 8.2.1.2Detailed Design Procedure
        3. 8.2.1.3Application Curve
    3. 8.3System Examples
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1Layout Guidelines
    2. 10.2Layout Example
  11. 11Device and Documentation Support
    1. 11.1Receiving Notification of Documentation Updates
    2. 11.2Community Resources
    3. 11.3Trademarks
    4. 11.4Electrostatic Discharge Caution
    5. 11.5Glossary
  12. 12Mechanical, Packaging, and Orderable Information

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)(2)
MINMAXUNIT
Supply voltage–0.235V
Output voltage–16V
Output current10mA
Maximum Junction Temperature, TJmax150°C
Storage Temperature, TstgTO-CAN, TO-92 Package–60150°C
TO-220, SOIC Package–65150
(1) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications.
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its rated operating conditions.

6.2 ESD Ratings

VALUEUNIT
V(ESD)Electrostatic dischargeHuman-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)±2500V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
Specified operating temperature: TMIN to TMAX LM35, LM35A –55 150°C
LM35C, LM35CA–40110
LM35D0100
Supply Voltage (+VS) 430V

6.4 Thermal Information

THERMAL METRIC(1)(2)LM35UNIT
NDVLPDNEB
3 PINS8 PINS3 PINS
RθJAJunction-to-ambient thermal resistance 40018022090°C/W
RθJC(top)Junction-to-case (top) thermal resistance 24
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) For additional thermal resistance information, see Typical Application.

6.5 Electrical Characteristics: LM35A, LM35CA Limits

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETERTEST CONDITIONSLM35ALM35CAUNIT
TYPTESTED LIMIT(2)DESIGN LIMIT(3)TYPTESTED LIMIT(2)DESIGN LIMIT(3)
Accuracy(4)TA = 25°C±0.2±0.5±0.2±0.5°C
TA = –10°C±0.3±0.3±1
TA = TMAX±0.4±1±0.4±1
TA = TMIN±0.4±1±0.4±1.5
Nonlinearity(5)TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.18±0.35±0.15±0.3°C
Sensor gain
(average slope)
TMIN ≤ TA ≤ TMAX109.9 109.9mV/°C
–40°C ≤ TJ ≤ 125°C1010.110 10.1
Load regulation(1)
0 ≤ IL ≤ 1 mA
TA = 25°C±0.4±1±0.4±1mV/mA
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.5±3±0.5±3
Line regulation(1)TA = 25°C±0.01±0.05±0.01±0.05mV/V
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
±0.02±0.1±0.02±0.1
Quiescent current(6)VS = 5 V, 25°C56675667µA
VS = 5 V, –40°C ≤ TJ ≤ 125°C10513191114
VS = 30 V, 25°C56.26856.268
VS = 30 V, –40°C ≤ TJ ≤ 125°C105.513391.5116
Change of quiescent current(1)4 V ≤ VS ≤ 30 V, 25°C0.210.21µA
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
0.520.52
Temperature coefficient of quiescent current–40°C ≤ TJ ≤ 125°C0.390.50.390.5µA/°C
Minimum temperature for rate accuracyIn circuit of Figure 14, IL = 0 1.521.52°C
Long term stabilityTJ = TMAX, for 1000 hours ±0.08±0.08°C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.6 Electrical Characteristics: LM35A, LM35CA

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETERTEST CONDITIONSLM35ALM35CAUNIT
MINTYPMAXTYPTYPMAX
Accuracy(4)TA = 25°C±0.2±0.2°C
Tested Limit(2)±0.5±0.5
Design Limit(3)
TA = –10°C±0.3±0.3
Tested Limit(2)
Design Limit(3)±1
TA = TMAX±0.4±0.4
Tested Limit(2)±1±1
Design Limit(3)
TA = TMIN±0.4±0.4
Tested Limit(2)±1
Design Limit(3)±1.5
Nonlinearity(5)TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.18±0.15°C
Tested Limit(2)
Design Limit(3)±0.35±0.3
Sensor gain
(average slope)
TMIN ≤ TA ≤ TMAX10 10mV/°C
Tested Limit(2)9.9
Design Limit(3)9.9
–40°C ≤ TJ ≤ 125°C1010
Tested Limit(2)10.1
Design Limit(3)10.1
Load regulation(1)
0 ≤ IL ≤ 1 mA
TA = 25°C±0.4±0.4mV/mA
Tested Limit(2)±1±1
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.5±0.5
Tested Limit(2)
Design Limit(3)±3±3
Line regulation(1)TA = 25°C±0.01±0.01mV/V
Tested Limit(2)±0.05±0.05
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
±0.02±0.02
Tested Limit(2)
Design Limit(3)±0.1±0.1
Quiescent current(6)VS = 5 V, 25°C5656µA
Tested Limit(2)6767
Design Limit(3)
VS = 5 V,
–40°C ≤ TJ ≤ 125°C
10591
Tested Limit(2)
Design Limit(3)131114
VS = 30 V, 25°C56.256.2
Tested Limit(2)6868
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C
105.591.5
Tested Limit(2)
Design Limit(3)133116
Change of quiescent current(1)4 V ≤ VS ≤ 30 V, 25°C0.20.2µA
Tested Limit(2)11
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
0.50.5
Tested Limit(2)
Design Limit(3)22
Temperature coefficient of quiescent current–40°C ≤ TJ ≤ 125°C0.390.39µA/°C
Tested Limit(2)
Design Limit(3)0.50.5
Minimum temperature for rate accuracyIn circuit of Figure 14, IL = 0 1.51.5°C
Tested Limit(2)
Design Limit(3)22
Long term stabilityTJ = TMAX, for 1000 hours ±0.08±0.08°C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETERTEST CONDITIONSLM35LM35C, LM35DUNIT
TYPTESTED LIMIT(2)DESIGN LIMIT(3)TYPTESTED LIMIT(2)DESIGN LIMIT(3)
Accuracy, LM35, LM35C(4)TA = 25°C±0.4±1±0.4±1°C
TA = –10°C±0.5±0.5±1.5
TA = TMAX±0.8±1.5±0.8±1.5
TA = TMIN±0.8±1.5±0.8±2
Accuracy, LM35D(4)TA = 25°C±0.6±1.5°C
TA = TMAX±0.9±2
TA = TMIN±0.9±2
Nonlinearity(4)TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.3±0.5±0.2±0.5°C
Sensor gain
(average slope)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
109.8 109.8mV/°C
1010.21010.2
Load regulation(1)
0 ≤ IL ≤ 1 mA
TA = 25°C±0.4±2±0.4±2mV/mA
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.5±5±0.5±5
Line regulation(1)TA = 25°C±0.01±0.1±0.01±0.1mV/V
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
±0.02±0.2±0.02±0.2
Quiescent current(5)VS = 5 V, 25°C56805680µA
VS = 5 V, –40°C ≤ TJ ≤ 125°C10515891138
VS = 30 V, 25°C56.28256.282
VS = 30 V, –40°C ≤ TJ ≤ 125°C105.516191.5141
Change of quiescent current(1)4 V ≤ VS ≤ 30 V, 25°C0.220.22µA
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
0.530.53
Temperature coefficient of quiescent current–40°C ≤ TJ ≤ 125°C0.390.70.390.7µA/°C
Minimum temperature for rate accuracyIn circuit of Figure 14, IL = 0 1.521.52°C
Long term stabilityTJ = TMAX, for 1000 hours ±0.08±0.08°C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(5) Quiescent current is defined in the circuit of Figure 14.

6.8 Electrical Characteristics: LM35, LM35C, LM35D

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETERTEST CONDITIONSLM35LM35C, LM35DUNIT
MINTYPMAXMINTYPMAX
Accuracy, LM35, LM35C(4)TA = 25°C±0.4±0.4°C
Tested Limit(2)±1±1
Design Limit(3)
TA = –10°C±0.5±0.5
Tested Limit(2)
Design Limit(3)±1.5
TA = TMAX±0.8±0.8
Tested Limit(2)±1.5
Design Limit(3)±1.5
TA = TMIN±0.8±0.8
Tested Limit(2)
Design Limit(3)±1.5±2
Accuracy, LM35D(4)TA = 25°C±0.6°C
Tested Limit(2)±1.5
Design Limit(3)
TA = TMAX±0.9
Tested Limit(2)
Design Limit(3)±2
TA = TMIN±0.9
Tested Limit(2)
Design Limit(3)±2
Nonlinearity(5)TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.3±0.2°C
Tested Limit(2)
Design Limit(3)±0.5±0.5
Sensor gain
(average slope)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
10 10mV/°C
Tested Limit(2)9.8
Design Limit(3)9.8
1010
Tested Limit(2)10.2
Design Limit(3)10.2
Load regulation(1)
0 ≤ IL ≤ 1 mA
TA = 25°C±0.4±0.4mV/mA
Tested Limit(2)±2±2
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C
±0.5±0.5
Tested Limit(2)
Design Limit(3)±5±5
Line regulation(1)TA = 25°C±0.01±0.01mV/V
Tested Limit(2)±0.1
Design Limit(3)±0.1
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
±0.02±0.02
Tested Limit(2)
Design Limit(3)±0.2±0.2
Quiescent current(6)VS = 5 V, 25°C5656µA
Tested Limit(2)8080
Design Limit(3)
VS = 5 V, –40°C ≤ TJ ≤ 125°C10591
Tested Limit(2)
Design Limit(3)158138
VS = 30 V, 25°C56.256.2
Tested Limit(2)8282
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C
105.591.5
Tested Limit(2)
Design Limit(3)161141
Change of quiescent current(1)4 V ≤ VS ≤ 30 V, 25°C0.20.2µA
Tested Limit(2)2
Design Limit(3)2
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C
0.50.5
Tested Limit(2)
Design Limit(3)33
Temperature coefficient of quiescent current–40°C ≤ TJ ≤ 125°C0.390.39µA/°C
Tested Limit(2)
Design Limit(3)0.70.7
Minimum temperature for rate accuracyIn circuit of Figure 14, IL = 0 1.51.5°C
Tested Limit(2)
Design Limit(3)22
Long term stabilityTJ = TMAX, for 1000 hours ±0.08±0.08°C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.9 Typical Characteristics

LM35 C001_SNIS159.png Figure 1. Thermal Resistance Junction To Air
LM35 C003_SNIS159.png Figure 3. Thermal Response In Still Air
LM35 C005_SNIS159.png Figure 5. Minimum Supply Voltage vs Temperature
LM35 C007_SNIS159.png Figure 7. Quiescent Current vs Temperature (in Circuit of Full-Range Centigrade Temperature Sensor)
LM35 C009_SNIS159.png Figure 9. Accuracy vs Temperature (Ensured)
LM35 C011_SNIS159.png Figure 11. Start-Up Response
LM35 C002_SNIS159.png Figure 2. Thermal Time Constant
LM35 C004_SNIS159.png Figure 4. Thermal Response In Stirred Oil Bath
LM35 C006_SNIS159.png Figure 6. Quiescent Current vs Temperature (in Circuit of Figure 14)
LM35 C008_SNIS159.png Figure 8. Accuracy vs Temperature (Ensured)
LM35 C010_SNIS159.png Figure 10. Noise Voltage