SCAN921226H

ACTIVE

High temperature 20 to 80-MHz 10-bit deserializer with IEEE 1149.1 test access

Product details

Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
Protocols Catalog Rating Catalog Operating temperature range (°C) -40 to 125
NFBGA (NZA) 49 49 mm² 7 x 7
  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

  • High Temperature Operation to 125°C
  • IEEE 1149.1 (JTAG) Compliant and At-Speed BIST Test Mode
  • Clock Recovery from PLL Lock to Random Data Patterns
  • Ensured Transition Every Data Transfer Cycle
  • Chipset (Tx + Rx) Power Consumption < 600 mW (Typ) @ 80 MHz
  • Single Differential Pair Eliminates Multi-Channel Skew
  • 800 Mbps Serial Bus LVDS Data Rate (at 80 MHz Clock)
  • 10-bit Parallel Interface for 1 Byte Data Plus 2 Control Bits
  • Synchronization Mode and LOCK Indicator
  • Programmable Edge Trigger on Clock
  • High Impedance on Receiver Inputs When Power is Off
  • Bus LVDS Serial Output Rated for 27Ω Load
  • Small 49-Lead NFBGA Package

All trademarks are the property of their respective owners.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock.

Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed.

The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock ensures a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into tri-state to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz.

Download View video with transcript Video

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 2
Type Title Date
* Data sheet High Temp 20-80MHz 10Bit Bus LVDS SerDes w/IEEE 1149.1 JTAG & at-speed BIST datasheet (Rev. C) 02 May 2013
Application note DS15BA101 & DS15EA101 Enable Long Reach Applications for Embedded Clock SER/DES (Rev. E) 29 Apr 2013

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Simulation tool

TINA-TI — SPICE-based analog simulation program

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
User guide: PDF
Package Pins Download
NFBGA (NZA) 49 View options

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Support & training

TI E2E™ forums with technical support from TI engineers

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos