SN54AC02-DIE

ACTIVE

Product details

Product type Logic Die or wafer type Tested Die Rating Space Operating temperature range (°C) 25 to 25
Product type Logic Die or wafer type Tested Die Rating Space Operating temperature range (°C) 25 to 25
DIESALE (TD) See data sheet
  • AC Types Feature 1.5-V to 5.5-V Operation
  • Rad-Tolerant: 50 KRad(Si) TID(1)
    • TID Dose Rate < 2 mRad/sec

(1) Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact factory for details.

  • AC Types Feature 1.5-V to 5.5-V Operation
  • Rad-Tolerant: 50 KRad(Si) TID(1)
    • TID Dose Rate < 2 mRad/sec

(1) Radiation tolerance is a typical value based upon initial device qualification. Radiation Lot Acceptance Testing is available - contact factory for details.

The SN54AC02-DIE device contains four independent 2-input NOR gates that perform the Boolean function Y = AB or Y = A + B in positive logic.

The SN54AC02-DIE device contains four independent 2-input NOR gates that perform the Boolean function Y = AB or Y = A + B in positive logic.

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Technical documentation

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Type Title Date
* Data sheet Rad-Tolerant Space Grade Die, Quadruple 2-Input Positive-NOR Gates datasheet 22 May 2013
Selection guide TI Space Products (Rev. I) 03 Mar 2022
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 Jul 2021
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
More literature HiRel Unitrode Power Management Brochure 07 Jul 2009
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 Aug 2002
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 01 Jun 1997
Application note Designing With Logic (Rev. C) 01 Jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 Oct 1996
Application note Live Insertion 01 Oct 1996
Application note Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 01 Apr 1996

Design & development

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