Home Amplifiers Comparators
Home
Amplifiers
Comparators

TLC372-EP

ACTIVE

Enhanced Product Lincmos Dual Differential Comparators

Order now
Data sheet

TLC372-EP

ACTIVE
Data sheet Order now

Product details

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 0.2 Vs (max) (V) 16 Vs (min) (V) 4 Vos (offset voltage at 25°C) (max) (mV) 5 Iq per channel (typ) (mA) 0.075 Input bias current (±) (max) (nA) 0.03 Rail-to-rail In to V- Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 VICR (max) (V) 15 VICR (min) (V) 0
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 0.2 Vs (max) (V) 16 Vs (min) (V) 4 Vos (offset voltage at 25°C) (max) (mV) 5 Iq per channel (typ) (mA) 0.075 Input bias current (±) (max) (nA) 0.03 Rail-to-rail In to V- Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125 VICR (max) (V) 15 VICR (min) (V) 0
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)
  • Single or Dual-Supply Operation
  • Wide Range of Supply Voltages . . .4 V to 18 V
  • Very Low Supply Current Drain . . .150 µA Typ at 5 V
  • Fast Response Time . . . 200 ns Typ for TTL-Level Input Step
  • Built-in ESD Protection
  • High Input Impedance . . . 1012 Typ
  • Extremely Low Input Bias Current. . .5 pA Typ
  • Ultrastable Low Input Offset Voltage
  • Input Offset Voltage Change at Worst-Case Input Conditions Typically 0.23 µV/Month, Including the First 30 Days
  • Common-Mode Input Voltage Range Includes Ground
  • Output Compatible With TTL, MOS, and CMOS
  • Pin-Compatible With LM393

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

LinCMOS is a trademark of Texas Instruments.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)
  • Single or Dual-Supply Operation
  • Wide Range of Supply Voltages . . .4 V to 18 V
  • Very Low Supply Current Drain . . .150 µA Typ at 5 V
  • Fast Response Time . . . 200 ns Typ for TTL-Level Input Step
  • Built-in ESD Protection
  • High Input Impedance . . . 1012 Typ
  • Extremely Low Input Bias Current. . .5 pA Typ
  • Ultrastable Low Input Offset Voltage
  • Input Offset Voltage Change at Worst-Case Input Conditions Typically 0.23 µV/Month, Including the First 30 Days
  • Common-Mode Input Voltage Range Includes Ground
  • Output Compatible With TTL, MOS, and CMOS
  • Pin-Compatible With LM393

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

LinCMOS is a trademark of Texas Instruments.

This device is fabricated using LinCMOS™ technology and consists of two independent voltage comparators, each designed to operate from a single power supply. Operation from dual supplies is also possible if the difference between the two supplies is 4 V to 18 V. Each device features extremely high input impedance (typically greater than 1012), allowing direct interfacing with high-impedance sources. The outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND relationships.

The TLC372 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V ESD rating using human-body-model (HBM) testing. However, care should be exercised in handling this device as exposure to ESD may result in a degradation of the device parametric performance.

The TLC372 is characterized for operation from -55°C to 125°C.

This device is fabricated using LinCMOS™ technology and consists of two independent voltage comparators, each designed to operate from a single power supply. Operation from dual supplies is also possible if the difference between the two supplies is 4 V to 18 V. Each device features extremely high input impedance (typically greater than 1012), allowing direct interfacing with high-impedance sources. The outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND relationships.

The TLC372 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V ESD rating using human-body-model (HBM) testing. However, care should be exercised in handling this device as exposure to ESD may result in a degradation of the device parametric performance.

The TLC372 is characterized for operation from -55°C to 125°C.
open-in-new Find other Comparators
Download View video with transcript Video

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 4
Type Title Date
* Data sheet TLC372-EP datasheet 23 Mar 2007
* VID TLC372-EP VID V6206675 21 Jun 2016
* Radiation & reliability report TLC372MDREP Reliability Report 02 Feb 2016
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 Mar 2017

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Request
Simulation tool

TINA-TI — SPICE-based analog simulation program

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
User guide: PDF
View options
Package Pins Download
SOIC (D) 8 View options
TI's Standard Terms and Conditions for Evaluation Items apply.

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Recommended products may have parameters, evaluation modules or reference designs related to this TI product.

Support & training

TI E2E™ forums with technical support from TI engineers

View all forum topics

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos