High Speed High Drive Precision Operational Amplifier - TLE2141M


High Speed High Drive Precision Operational Amplifier


Other devices and data sheet

Other device variants can also be found in the  TLE2141M-D product page

This data sheet applies to both  TLE2141M and  TLE2141M-D


The TLE2141M and TLE2141AM are high-performance, internally compensated operational amplifiers built using Texas Instruments complementary bipolar Excalibur process. The TLE2141AM is a tighter offset voltage grade of the TLE2141M. Both are pin-compatible upgrades to standard industry products.

The design incorporates a patent-pending input stage that simultaneously achieves low audio band noise of 10.5 nV/√Hz with a 10-Hz 1/f corner and symmetrical 40-V/µs slew rate typically with loads up to 800 pF. The resulting low distortion and high power bandwidth are important in high-fidelity audio applications. A fast settling time of 340 ns to 0.1% of a 10-V step with a 2-kΩ/100-pF load is useful in fast actuator/positioning drivers. Under similar test conditions, settling time to 0.01% is 400 ns.

The devices are stable with capacitive loads up to 10 nF, although the 6-MHz bandwidth decreases to 1.8 MHz at this high loading level. As such, the TLE2141M and TLE2141AM are useful for low-droop sample and holds and direct buffering of long cables, including four 20-mA current loops.

The special design also exhibits an improved insensitivity to inherent IC component mismatches as is evidenced by a 500-µV maximum offset voltage and 1.7-µV/°C typical drift. Minimum common-mode rejection ratio and supply-voltage rejection ratio are 85 dB and 90 dB, respectively.

Device performance is relatively independent of supply voltage over the ±2-V to ±22-V range. Inputs can operate between VCC– –0.3 to VCC+ –1.8 V without inducing phase reversal, although excessive input current may flow out of each input exceeding the lower common-mode input range. The all NPN output stage provides a nearly rail-to-rail output swing of VCC– +0.1 to VCC+ –1 V under light current loading conditions. The device can sustain shorts to either supply since output current is internally limited, but care must be taken to ensure that maximum package power dissipation is not exceeded.

Both versions can also be used as comparators. Differential inputs of VCC± can be maintained without damage to the device. Open-loop propagation delay with TTL supply levels is typically 200 ns. This gives a good indication as to output stage saturation recovery when the device is overdriven beyond the limits of recommended output swing.

Both the TLE2141M and TLE2141AM are available in a wide variety of packages, including both the industry-standard 8-pin small-outline version and chip form for high-density system applications. The M-suffix is characterized for operation over the full military temperature range of –55°C to 125°C.


  • Low Noise:
    • 10 Hz . . . 15 nV/√Hz
    • 1 kHz . . . 10.5 nV/√Hz
  • 10000-pF Load Capability
  • 20-mA Min Short-Circuit Output Current
  • 30-V/µs Min Slew Rate
  • High Gain-Bandwidth Product . . . 5.9 MHz
  • Low VIO . . . 500 µV Max at 25°C
  • Single or Split Supply . . . 4 V to 44 V
  • Fast Settling Time
    • 340 ns to 0.1%
    • 400 ns to 0.01%
  • Saturation Recovery . . . 150 ns
  • Large Output Swing . . . VCC– +0.1 V
    to VCC+ – 1 V

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Parametrics Compare all products in Operational Amplifiers

Number of Channels (#)
Total Supply Voltage (Min) (+5V=5, +/-5V=10)
Total Supply Voltage (Max) (+5V=5, +/-5V=10)
GBW (Typ) (MHz)
Slew Rate (Typ) (V/us)
Vos (Offset Voltage @ 25C) (Max) (mV)
Iq per channel (Typ) (mA)
Operating Temperature Range (C)
Package Group
Output Current (Typ) (mA)
Offset Drift (Typ) (uV/C)
Vn at 1kHz (Typ) (nV/rtHz)
Additional Features
IIB (Max) (pA)
CMRR (Typ) (dB)
Package Size: mm2:W x L (PKG)
In to V-   
-55 to 125   
High Cload Drive   
See datasheet (CDIP)   

Other qualified versions of TLE2141M

Version Part Number Definition
Catalog TLE2141 TI's standard catalog product
Enhanced Product TLE2141-EP Supports Defense, Aerospace and Medical Applications
Automotive TLE2141-Q1 Q100 devices qualified for high-reliability automotive applications targeting zero defects