Wireline test equipment (LAN, DSL, cable)

LAN/WAN test equipment design IC solutions from TI


Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the LAN/WAN signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.

    High-performing LAN / WAN test equipment often requires:

  • High-speed data converters that help with timing and noise margin measurement
  • Low-phase noise clocks for improved timing margins and jitter measurements
  • Efficient power supply that minimizes board area and improves thermal performance
  • Low EMI power architecture that improves system sensitivity and dynamic range

Technical documents

Application notes & user guides

Application Notes (5)

Title Abstract Type Size (KB) Date Views
HTM 9 KB 08 Aug 2017 0
HTM 9 KB 20 Jul 2017 0
PDF 1.63 MB 21 Jul 2016 0
HTM 8 KB 26 Apr 2013 0
HTM 8 KB 25 Apr 2010 0

User Guides (1)

Title Abstract Type Size (KB) Date Views
htm 8 KB 20 Sep 2018 0

Product bulletin & white papers

White Papers (1)

Title Abstract Type Size (MB) Date Views
PDF 91 KB 01 May 2007 0


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