LAN / WAN Test Equipment

LAN/WAN test equipment design IC solutions from TI


Below find Integrated circuits and reference designs for LAN/WAN test equipment complete with schematics, test data and design files showing:

  • Design techniques for high performance and high speed data acquisition and arbitrary waveform generation
  • Signal chain design methodology for high performance analog front ends using GSPS ADCs and GSPS DACs
  • Design optimizations for wideband, high SNR and high dynamic range amplifiers and ADC drivers

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