Wireline test equipment (LAN, DSL, cable)

LAN/WAN test equipment design IC solutions from TI

Description

Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the LAN/WAN signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.

    High-performing LAN / WAN test equipment often requires:

  • High-speed data converters that help with timing and noise margin measurement
  • Low-phase noise clocks for improved timing margins and jitter measurements
  • Efficient power supply that minimizes board area and improves thermal performance
  • Low EMI power architecture that improves system sensitivity and dynamic range
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Technical documents

Application notes & user guides

Application Notes (5)

Title Abstract Type Size (KB) Date
HTM 9 KB 08 Aug 2017
HTM 9 KB 20 Jul 2017
PDF 1.63 MB 21 Jul 2016
HTM 8 KB 26 Apr 2013
HTM 8 KB 25 Apr 2010

User Guides (1)

Title Abstract Type Size (KB) Date
htm 8 KB 20 Sep 2018

Product bulletin & white papers

White Papers (1)

Title Abstract Type Size (MB) Date
PDF 91 KB 01 May 2007

Blogs

Support & training

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