LAN / WAN Test Equipment

LAN/WAN test equipment design IC solutions from TI


Below find Integrated circuits and reference designs for LAN/WAN test equipment complete with schematics, test data and design files showing:

  • Design techniques for high performance and high speed data acquisition and arbitrary waveform generation
  • Signal chain design methodology for high performance analog front ends using GSPS ADCs and GSPS DACs
  • Design optimizations for wideband, high SNR and high dynamic range amplifiers and ADC drivers

Technical documents

Application notes & user guides

Application Notes (5)

Title Abstract Type Size (KB) Date Views
HTM 9 KB 08 Aug 2017 474
HTM 9 KB 20 Jul 2017 111
PDF 1.63 MB 21 Jul 2016 305
HTM 8 KB 26 Apr 2013 443
HTM 8 KB 25 Apr 2010 82

User Guides (1)

Title Abstract Type Size (KB) Date Views
htm 8 KB 31 Jan 2017 121

Product bulletin & white papers

White Papers (1)

Title Abstract Type Size (MB) Date Views
PDF 91 KB 01 May 2007 252

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