X-ray: Baggage ScannerX-ray Baggage Scanner Solutions from Texas Instruments |
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X-ray: Baggage ScannerX-ray Baggage Scanner Solutions from Texas Instruments |
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Design ConsiderationsX-ray inspection is commonly used for security screening of baggage, such as checked and carry-on luggage at airports. The items to be inspected are subjected to x-ray radiation and the unabsorbed radiation passing through the items is collected on photo-detector (typically photodiode) arrays. These detectors output very low-level currents which require special signal conditioning and high resolution data converters are needed to achieve the required resolution to image the scanned items properly. Sometimes this signal conditioning is contained within a single-chip data acquisition solution such as the case where the current-to-voltage (I-to-V) conversion is included with the precision analog-to-digital converter (ADC). Other times discrete very low-current/noise front-end amplifiers measure and amplify the outputs from the photo-detector array and then drive stand-alone voltage-input ADCs. The core system includes:
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| Title | Abstract | Type | Size (MB) | Date | Views |
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| 228 KB | 09 Jun 2011 | 1206 | |||
| 208 KB | 25 Apr 2011 | 1999 |
| Title | Abstract | Type | Size (MB) | Date | Views |
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| 1014 KB | 17 May 2011 | 1929 | |||
| 562 KB | 21 Dec 2010 | 1323 | |||
| 423 KB | 09 Nov 2010 | 1292 | |||
| 180 KB | 26 Oct 2009 | 749 |
| Name | Type | Available During |
| Recorded Content | On Demand | |
| Recorded Content | On Demand |