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Introduction Test and Measurement equipment is used throughout the entire life cycle to design, verify, test and service products. These products can be electronic (such as a solar inverter, MP3 player, cell phone, radar system, etc.) or mechanical (such as a wind turbine, car suspension, machine health monitoring, jet propulsion system, etc.). Just as products typically grow in capabilities and lower in cost over time, Test & Measurement equipment must follow suit. These trends demand greater accuracy, higher speed, and lower cost test equipment. In addition, pressure to shorten development time and reduce costs leads equipment designers to move away from proprietary or custom technology to commercially available components. These requirements push the performance envelope of processors, Analog to Digital converters (ADCs), Digital to Analog converters (DACs), and amplifiers. Availability of higher performance, lower power and lower cost DSPs and SoCs capable of handling math-intensive signal processing as well as system control and management functionality is enabling completely software-based system design. These trends reduce time-to-market, enable quick feature development, enable development of a reusable platform for multiple products and reduce overall system power and cost. Texas Instruments offers a broad portfolio of processors, high performance analog and power management solutions to address these demanding requirements. Automated Test Equipment Automated Test Equipment (ATE) systems are used to test power, mixed-signal RF, memory and logic integrated circuits (ICs). As ICs increase in performance and complexity, test systems must follow by lowering total cost of test, shortening test time per device and increasing test coverage to improve yield.
Automated Inspection The goal of automated inspection systems is to verify that the circuit board was manufactured correctly and the components were correctly placed and soldered down. Companies utilize a comprehensive strategy that encompasses many different types of inspection. These can include x-ray, automated optical inspection (AOI) and in-circuit test. Related System Block Diagrams
Bench & Lab Test Instrumentation, such as oscilloscopes, digital multimeters and programmable power supplies, are used throughout the product lifecycle to debug printed circuit board designs on the lab bench as well as in automated functional test systems to guarantee that the end product is operating to specification. The systems can be found in product validation labs in activities such as Highly Accelerated Lifecycle Testing (HALT) and Highly Automated Stress Screening (HASS). Related System Block Diagrams Field & Portable Test Finally, field service technicians utilize equipment such as handheld digital multimeters to diagnose and repair field failures. Related System Block Diagrams |
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