SBAS520C February   2011  – June 2017 ADS4122 , ADS4125 , ADS4142 , ADS4145

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Family Comparison
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics: ADS412x
    6. 7.6  Electrical Characteristics: ADS414x
    7. 7.7  Electrical Characteristics: General
    8. 7.8  Digital Characteristics
    9. 7.9  Timing Requirements: LVDS and CMOS Modes
    10. 7.10 Serial Interface Timing Characteristics
    11. 7.11 Reset Timing Requirements
    12. 7.12 Timing Characteristics at Lower Sampling Frequencies
    13. 7.13 Typical Characteristics: ADS4122
    14. 7.14 Typical Characteristics: ADS4125
    15. 7.15 Typical Characteristics: ADS4142
    16. 7.16 Typical Characteristics: ADS4145
    17. 7.17 Typical Characteristics: Common
    18. 7.18 Typical Characteristics: Contour
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Feature Description
      1. 8.3.1 Digital Functions and Low-Latency Mode
      2. 8.3.2 Gain for SFDR, SNR Trade-Off
      3. 8.3.3 Offset Correction
      4. 8.3.4 Power-Down
        1. 8.3.4.1 Power-Down Global
        2. 8.3.4.2 Standby
        3. 8.3.4.3 Output Buffer Disable
        4. 8.3.4.4 Input Clock Stop
      5. 8.3.5 Output Data Format
    4. 8.4 Device Functional Modes
      1. 8.4.1 Digital Output Information
        1. 8.4.1.1 Output Interface
        2. 8.4.1.2 DDR LVDS Outputs
        3. 8.4.1.3 LVDS Output Data and Clock Buffers
        4. 8.4.1.4 Parallel CMOS Interface
        5. 8.4.1.5 CMOS Interface Power Dissipation
    5. 8.5 Programming
      1. 8.5.1 Device Configuration
      2. 8.5.2 Serial Interface
        1. 8.5.2.1 Register Initialization
      3. 8.5.3 Serial Register Readout
    6. 8.6 Register Maps
      1. 8.6.1 Serial Register Map
      2. 8.6.2 Description of Serial Registers
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Analog Input
        1. 9.1.1.1 Drive Circuit Requirements
        2. 9.1.1.2 Driving Circuit
        3. 9.1.1.3 Input Common-Mode
      2. 9.1.2 Clock Input
      3. 9.1.3 Input Overvoltage Indication (OVR Pin)
      4. 9.1.4 Using the ADS41xx at Low Sampling Rates
        1. 9.1.4.1 ADS412x (12-Bit Device)
        2. 9.1.4.2 ADS414x (14-Bit Device)
        3. 9.1.4.3 Power Consumption at Low Sampling Rates
        4. 9.1.4.4 Output Timing at Low Sampling Rates
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Analog Input
        2. 9.2.2.2 Clock Driver
        3. 9.2.2.3 Digital Interface
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Sharing DRVDD and AVDD Supplies
    2. 10.2 Using DC-DC Power Supplies
    3. 10.3 Power Supply Bypassing
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Grounding
      2. 11.1.2 Supply Decoupling
      3. 11.1.3 Exposed Pad
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documentation
    3. 12.3 Related Links
    4. 12.4 Receiving Notification of Documentation Updates
    5. 12.5 Community Resources
    6. 12.6 Trademarks
    7. 12.7 Electrostatic Discharge Caution
    8. 12.8 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9 Application and Implementation

NOTE

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.

9.1 Application Information

The ADS412x and ADS414x are lower sampling speed members of the ADS41xx family of ultra-low-power analog-to-digital converters (ADCs). The conversion process is initiated by a rising edge of the external input clock and the analog input signal is sampled. The sampled signal is sequentially converted by a series of small resolution stages, with the outputs combined in a digital correction logic block. At every clock edge the sample propagates through the pipeline, resulting in a data latency of 10 clock cycles. The output is available as 14-bit data or 12-bit data, in DDR LVDS mode or CMOS mode, and coded in either straight offset binary or binary twos complement format.

9.1.1 Analog Input

The analog input consists of a switched-capacitor-based, differential, sample-and-hold architecture. This differential topology results in very good ac performance even for high input frequencies at high sampling rates. The INP and INM pins must be externally biased around a common-mode voltage of 0.95 V, available on the VCM pin. For a full-scale differential input, each input INP and INM pin must swing symmetrically between (VCM + 0.5 V) and (VCM – 0.5 V), resulting in a 2-VPP differential input swing. The input sampling circuit has a high
3-dB bandwidth that extends up to 550 MHz (measured from the input pins to the sampled voltage). Figure 105 shows an equivalent circuit for the analog input.

ADS4122 ADS4125 ADS4142 ADS4145 ai_ana_in_equiv_cir_bas483.gif Figure 105. Analog Input Equivalent Circuit

9.1.1.1 Drive Circuit Requirements

For optimum performance, the analog inputs must be driven differentially. This technique improves the common-mode noise immunity and even-order harmonic rejection. A 5-Ω to 15-Ω resistor in series with each input pin is recommended to damp out ringing caused by package parasitics. Low impedance (less than 50 Ω) must be present for the common-mode switching currents. This impedance can be achieved by using two resistors from each input terminated to the common-mode voltage (VCM).

Note that the device includes an internal R-C filter from each input to ground. The purpose of this filter is to absorb the glitches caused by the opening and closing of the sampling capacitors. The cutoff frequency of the R-C filter involves a trade-off. A lower cutoff frequency (larger C) absorbs glitches better, but also reduces the input bandwidth and the maximum input frequency that can be supported. On the other hand, with no internal R-C filter, high input frequency can be supported but now the sampling glitches must be supplied by the external driving circuit. The inductance of the package bond wires limits the ability of the external driving circuit to support the sampling glitches.

In the ADS412x and ADS414x, the R-C component values are optimized when supporting high input bandwidth (550 MHz). However, in applications where very high input frequency support is not required, filtering of the glitches can be improved further with an external R-C-R filter; see Figure 108 and Figure 109).

In addition, the drive circuit may have to be designed to provide a low insertion loss over the desired frequency range and matched impedance to the source. When designing the drive circuit, the ADC impedance must be considered. Figure 106 and Figure 107 show the impedance (ZIN = RIN || CIN) looking into the ADC input pins.

ADS4122 ADS4125 ADS4142 ADS4145 ai_adc_rin-frq_bas483.gif Figure 106. ADC Analog Input Resistance (RIN) Across Frequency
ADS4122 ADS4125 ADS4142 ADS4145 ai_adc_cin-frq_bas483.gif Figure 107. ADC Analog Input Capacitance (CIN) Across Frequency

9.1.1.2 Driving Circuit

Two example driving circuit configurations are shown in Figure 108 and Figure 109—one optimized for low bandwidth (low input frequencies) and the other one for high bandwidth to support higher input frequencies. In Figure 108, an external R-C-R filter with 3.3 pF is used to help absorb sampling glitches. The R-C-R filter limits the bandwidth of the drive circuit, making the drive circuit suitable for low input frequencies (up to 250 MHz). Transformers such as ADT1-1WT or WBC1-1 can be used up to 250 MHz.

For higher input frequencies, the R-C-R filter can be dropped. Together with the lower series resistors (5 Ω to 10 Ω), this drive circuit provides higher bandwidth to support frequencies up to 500 MHz (as shown in Figure 109). A transmission line transformer such as ADTL2-18 can be used.

Note that both the drive circuits have been terminated by 50 Ω near the ADC side. The termination is accomplished by a 25-Ω resistor from each input to the 0.95-V common-mode (VCM) from the device. This termination allows the analog inputs to be biased around the required common-mode voltage.

ADS4122 ADS4125 ADS4142 ADS4145 ai_drvr_lo_bw_bas483.gif Figure 108. Drive Circuit With Low Bandwidth (for Low Input Frequencies)
ADS4122 ADS4125 ADS4142 ADS4145 ai_drvr_hi_bw_bas483.gif Figure 109. Drive Circuit With High Bandwidth (for High Input Frequencies)

The mismatch in the transformer parasitic capacitance (between the windings) results in degraded even-order harmonic performance. Connecting two identical RF transformers back-to-back helps minimize this mismatch and good performance is obtained for high-frequency input signals. An additional termination resistor pair may be required between the two transformers, as shown in Figure 108 and Figure 109. The center point of this termination is connected to ground to improve the balance between the P (positive) and M (negative) sides. The values of the terminations between the transformers and on the secondary side must be chosen to obtain an effective 50 Ω (for a 50-Ω source impedance).

Figure 108 and Figure 109 use 1:1 transformers with a 50-Ω source. As explained in the Drive Circuit Requirements section, this architecture helps to present a low source impedance to absorb sampling glitches. With a 1:4 transformer, the source impedance is 200 Ω. The higher source impedance is unable to absorb the sampling glitches effectively and can lead to degradation in performance (compared to using 1:1 transformers).

In almost all cases, either a band-pass or low-pass filter is needed to obtain the desired dynamic performance, as shown in Figure 110. Such a filter presents low source impedance at the high frequencies corresponding to the sampling glitch and helps avoid the performance loss with the high source impedance.

ADS4122 ADS4125 ADS4142 ADS4145 ai_drv_cir_vhi_frq_bas483.gif Figure 110. Drive Circuit With 1:4 Transformer

9.1.1.3 Input Common-Mode

To ensure a low-noise, common-mode reference, the VCM pin is filtered with a 0.1-µF low-inductance capacitor connected to ground. The VCM pin is designed to directly drive the ADC inputs. Each ADC input pin sinks a common-mode current of approximately 0.6 µA per MSPS of clock frequency.

9.1.2 Clock Input

The ADS412x and ADS414x clock inputs can be driven differentially (sine, LVPECL, or LVDS) or single-ended (LVCMOS), with little or no difference in performance between them. The common-mode voltage of the clock inputs is set to VCM using internal 5-kΩ resistors. This setting allows the use of transformer-coupled drive circuits for sine-wave clock or ac-coupling for LVPECL and LVDS clock sources. Figure 111 shows an equivalent circuit for the input clock.

ADS4122 ADS4125 ADS4142 ADS4145 ai_clkin_equiv_cir_bas483.gif
NOTE: CEQ is 1 pF to 3 pF, and is the equivalent input capacitance of the clock buffer.
Figure 111. Input Clock Equivalent Circuit

A single-ended CMOS clock can be ac-coupled to the CLKP input, with CLKM connected to ground with a 0.1-μF capacitor, as shown in Figure 112. For best performance, the clock inputs must be driven differentially, reducing susceptibility to common-mode noise. For high input frequency sampling, TI recommends using a clock source with very low jitter. Band-pass filtering of the clock source can help reduce the effects of jitter. There is no change in performance with a non-50% duty cycle clock input. Figure 113 shows a differential circuit.

ADS4122 ADS4125 ADS4142 ADS4145 ai_drv_cir_1end_bas483.gif Figure 112. Single-Ended Clock Driving Circuit
ADS4122 ADS4125 ADS4142 ADS4145 ai_drv_cir_diff_bas483.gif Figure 113. Differential Clock Driving Circuit

9.1.3 Input Overvoltage Indication (OVR Pin)

The device has an OVR pin that provides information about analog input overload. At any clock cycle, if the sampled input voltage exceeds the positive or negative full-scale range, the OVR pin goes high. The OVR remains high as long as the overload condition persists. The OVR pin is a CMOS output buffer (running off DRVDD supply), independent of the type of output data interface (DDR, LVDS, or CMOS).

For a positive overload, the D[13:0] output data bits are 3FFFh in offset binary output format and 1FFFh in twos complement output format. For a negative input overload, the output code is 0000h in offset binary output format and 2000h in twos complement output format.

9.1.4 Using the ADS41xx at Low Sampling Rates

When ADS41xx is used at lower sampling rates (< 20 MSPS), set the LOW SPEED register bit (address DFh, bit[5:4]). At low sampling rates, use the device in CMOS interface mode which saves power and results in better setup and hold time compared to LVDS interface mode.

9.1.4.1 ADS412x (12-Bit Device)

ADS412x, 12-Bit Resolution, at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sine wave input clock, 1.5-VPP differential clock amplitude, 50% clock duty cycle, –1-dBFS differential analog input, 0-dB gain, low-latency mode, CMOS output interface, and 32k-point FFT, unless otherwise noted
ADS4122 ADS4125 ADS4142 ADS4145 D130_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz, SNR = 71 dBFS,
SFDR = 94 dBc, SINAD = 70.9 dBFS, THD = 91 dBc
Figure 114. FFT for 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D010_SBAS520.gif
fS = 5 MSPS, fIN = 12 MHz, SNR = 70.5 dBFS,
SFDR = 89 dBc, SINAD = 70.4 dBFS, THD = 87 dBc
Figure 116. FFT for 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D001_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz, SNR = 70.9 dBFS,
SFDR = 89 dBc, SINAD = 70.8 dBFS, THD = 87 dBc
Figure 115. FFT for 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D103_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz, SNR = 71.1 dBFS,
SFDR = 89 dBc, SINAD = 71 dBFS, THD = 86 dBc
Figure 117. FFT for 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D104_SBAS520.gif
fS = 10 MSPS, fIN = 12 MHz, SNR = 70.9 dBFS,
SFDR = 88 dBc, SINAD = 70.8 dBFS, THD = 86 dBc
Figure 118. FFT for 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D013_SBAS520.gif
fS = 20 MSPS, fIN = 12 MHz, SNR = 71.1 dBFS,
SFDR = 89 dBc, SINAD = 71 dBFS, THD = 87 dBc
Figure 120. FFT for 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D017_SBAS520.gif
fS = 50 MSPS, fIN = 12 MHz, SNR = 71 dBFS,
SFDR = 89 dBc, SINAD = 71.9 dBFS, THD = 87 dBc
Figure 122. FFT for 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D132_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz
Figure 124. Differential Nonlinearity at 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D101_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz
Figure 126. Differential Non-linearity at 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D106_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz
Figure 128. Differential Nonlinearity at 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D109_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz
Figure 130. Differential Nonlinearity at 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D112_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz
Figure 132. Differential Nonlinearity at 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D019_SBAS520.gif
fIN = 3 MHz
Figure 134. Performance Across Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D004_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz, SNR = 71.1 dBFS,
SFDR = 89 dBc, SINAD = 71 dBFS, THD = 87 dBc
Figure 119. FFT for 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D008_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz, SNR = 71 dBFS,
SFDR = 90 dBc, SINAD = 70.9 dBFS, THD = 87 dBc
Figure 121. FFT for 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D131_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz
Figure 123. Integral Nonlinearity at 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D100_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz
Figure 125. Integral Nonlinearity at 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D105_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz
Figure 127. Integral Nonlinearity at 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D108_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz
Figure 129. Integral Nonlinearity at 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D111_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz
Figure 131. Integral Nonlinearity at 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D129_SBAS520.gif
Figure 133. INL Histogram Across Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D020_SBAS520.gif
fIN = 12 MHz
Figure 135. Performance Across Sampling speed

9.1.4.2 ADS414x (14-Bit Device)

ADS414x, 14-Bit Resolution, at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sine wave input clock, 1.5-VPP differential clock amplitude, 50% clock duty cycle, –1-dBFS differential analog input, 0-dB gain, low-latency mode, CMOS output interface, and 32k-point FFT, unless otherwise noted.
ADS4122 ADS4125 ADS4142 ADS4145 D133_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz, SNR = 73.8 dBFS,
SFDR = 97 dBc, SINAD = 73.7 dBFS, THD = 90 dBc
Figure 136. FFT for 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D060_SBAS520.gif
fS = 5 MSPS, fIN = 12 MHz, SNR = 73 dBFS,
SFDR = 89 dBc, SINAD = 72.9 dBFS, THD = 87 dBc
Figure 138. FFT for 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D118_SBAS520.gif
fS = 10 MSPS, fIN = 12 MHz, SNR = 73.6 dBFS,
SFDR = 88 dBc, SINAD = 73.4 dBFS, THD = 86 dBc
Figure 140. FFT for 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D063_SBAS520.gif
fS = 20 MSPS, fIN = 12 MHz, SNR = 73.9 dBFS,
SFDR = 89 dBc, SINAD = 73.7 dBFS, THD = 87 dBc
Figure 142. FFT for 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D067_SBAS520.gif
fS = 50 MSPS, fIN = 12 MHz, SNR = 73.8 dBFS,
SFDR = 88 dBc, SINAD = 73.6 dBFS, THD = 86 dBc
Figure 144. FFT for 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D135_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz
Figure 146. Differential Nonlinearity at 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D115_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz
Figure 148. Differential Nonlinearity at 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D120_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz
Figure 150. Differential Nonlinearity at 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D123_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz
Figure 152. Differential Nonlinearity at 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D126_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz
Figure 154. Differential Nonlinearity at 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D116_SBAS520.gif
RMS = 1.1523 LSB
Figure 156. Output Noise Histogram (With Inputs shorted to VCM) at 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D124_SBAS520.gif
RMS = 1.104 LSB
Figure 158. Output Noise Histogram (With Inputs shorted to VCM) at 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D069_SBAS520.gif
fIN = 3 MHz
Figure 160. Performance Across Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D051_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz, SNR = 73.8 dBFS,
SFDR = 90 dBc, SINAD = 73.7 dBFS, THD = 87 dBc
Figure 137. FFT for 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D117_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz, SNR = 73.9 dBFS,
SFDR = 88 dBc, SINAD = 73.7 dBFS, THD = 86 dBc
Figure 139. FFT for 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D054_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz, SNR = 74 dBFS,
SFDR = 89 dBc, SINAD = 73.8 dBFS, THD = 87 dBc
Figure 141. FFT for 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D058_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz, SNR = 73.8 dBFS,
SFDR = 89 dBc, SINAD = 73.6 dBFS, THD = 86 dBc
Figure 143. FFT for 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D134_SBAS520.gif
fS = 3 MSPS, fIN = 4 MHz
Figure 145. Integral Nonlinearity at 3-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D114_SBAS520.gif
fS = 5 MSPS, fIN = 3 MHz
Figure 147. Integral Nonlinearity at 5-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D119_SBAS520.gif
fS = 10 MSPS, fIN = 3 MHz
Figure 149. Integral Nonlinearity at 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D122_SBAS520.gif
fS = 20 MSPS, fIN = 3 MHz
Figure 151. Integral Nonlinearity at 20-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D125_SBAS520.gif
fS = 50 MSPS, fIN = 3 MHz
Figure 153. Integral Nonlinearity at 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D128_SBAS520.gif
Figure 155. INL Histogram Across Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D121_SBAS520.gif
RMS = 1.080 LSB
Figure 157. Output Noise Histogram (With Inputs shorted to VCM) at 10-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D127_SBAS520.gif
RMS = 1.072 LSB
Figure 159. Output Noise Histogram (With Inputs shorted to VCM) at 50-MSPS Sampling Speed
ADS4122 ADS4125 ADS4142 ADS4145 D070_SBAS520.gif
fIN = 12 MHz
Figure 161. Performance Across Sampling Speed

9.1.4.3 Power Consumption at Low Sampling Rates

Figure 162 shows typical power consumption at lower sampling rates on each supply.

ADS4122 ADS4125 ADS4142 ADS4145 D071_SBAS520.gif Figure 162. Power vs Sample Rate

9.1.4.4 Output Timing at Low Sampling Rates

Table 9 describes the set-up and hold times for the digital outputs of the ADS41xx with respect to the output clock at low sampling rates.

Table 9. Output Timing at Low Sampling Rates in CMOS Mode(1)

SAMPLING FREQUENCY (MSPS) SETUP TIME, tSU HOLD TIME, tHO UNIT
MIN TYP MAX MIN TYP MAX
CMOS (Low Latency Enabled)
5 99.4 100.4 97.9 98.7 ns
10 49.0 49.7 48.5 49.3 ns
20 23.3 24.2 23.9 24.8 ns
30 15.0 15.8 15.7 16.6 ns
40 10.7 11.4 11.5 12.5 ns
50 8.2 9.0 9.1 10.0 ns
CMOS (Low Latency Disabled)
5 99.6 100.3 97.8 98.5 ns
10 49.1 49.7 48.2 49.1 ns
20 23.6 24.2 23.6 24.6 ns
30 15.2 15.7 15.3 16.4 ns
40 10.9 11.4 11.2 12.3 ns
50 8.4 8.9 8.6 9.8 ns
(1) Typical values are at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, CLOAD = 5 pF. Minimum values are across the full temperature range: TMIN= –40°C to TMAX = 85°C, AVDD = 1.8 V, and DRVDD = 1.7 V to 1.9 V.

9.2 Typical Application

An example schematic for a typical application of the ADS414x is shown in Figure 163.

ADS4122 ADS4125 ADS4142 ADS4145 Typical_Application_Schematic_ADS4122.gif Figure 163. Example Schematic for the ADS414x

9.2.1 Design Requirements

Example design requirements are listed in Table 10 for the ADC portion of the signal chain. These requirements do not necessary reflect the requirements of an actual system, but rather demonstrate why the ADS412x and ADS414x can be chosen for a system based on a set of requirements.

Table 10. Example Design Requirements for the ADS412x and ADS414x

DESIGN PARAMETER EXAMPLE DESIGN REQUIREMENT ADS4125 CAPABILITY
Sampling rate ≥ 122.88 MSPS Max sampling rate: 125 MSPS
Input frequency > 125 MHz to accommodate full 2nd Nyquist zone Large-signal, –3-dB bandwidth: 400-MHz operation
SNR > 68 dBFS at –1 dFBS, 170 MHz 72.2 dBFS at –1 dBFS, 170 MHz
SFDR > 77dBc at –1 dFBS, 170 MHz 81 dBc at –1 dBFS, 170 MHz
Input full scale voltage 2 VPP 2 VPP
Overload recovery time < 3 clock cycles 1 clock cycle
Digital interface Parallel LVDS Parallel LVDS
Power consumption < 200 mW per channel 153 mW per channel

9.2.2 Detailed Design Procedure

9.2.2.1 Analog Input

The analog input of the ADS412x and ADS414x is typically driven by a fully differential amplifier. The amplifier must have sufficient bandwidth for the frequencies of interest. The noise and distortion performance of the amplifier affect the combined performance of the ADC and amplifier. The amplifier is often ac-coupled to the ADC to allow both the amplifier and ADC to operate at the optimal common-mode voltages. The amplifier can be dc-coupled to the ADC if required. An alternate approach is to drive the ADC using transformers. DC coupling cannot be used with the transformer approach.

9.2.2.2 Clock Driver

The ADS412x and ADS414x must be driven by a high-performance clock driver such as a clock jitter cleaner. The clock must have low noise to maintain optimal performance. LVPECL is the most common clocking interface, but LVDS and LVCMOS can be used as well. TI does not advise driving the clock input from an FPGA unless the noise degradation can be tolerated, such as for input signals near dc where the clock noise impact is minimal.

9.2.2.3 Digital Interface

The ADS412x and ADS414x supports both LVDS and CMOS interfaces. The LVDS interface must be used for best performance when operating at maximum sampling rate. The LVDS outputs can be connected directly to the FPGA without any additional components. When using CMOS outputs resistors must be placed in series with the outputs to reduce the output current spikes to limit the performance degradation. The resistors must be large enough to limit current spikes but not so large as to significantly distort the digital output waveform. An external CMOS buffer must be used when driving distances greater than a few inches to reduce ground bounce within the ADC.

9.2.3 Application Curve

Figure 164 shows the results of a 100-MHz signal sampled at 65 MHz captured by the ADS4122.

ADS4122 ADS4125 ADS4142 ADS4145 D001_ADS4122.gif
SNR = 70.11 dBFS, SFDR = 87.74 dBFS,
THD = 84.33 dB, SINAD = 70.03 dBFS
Figure 164. 100-MHz Signal Captured by the ADS4122