SBAS984 March   2019 AFE2257

PRODUCTION DATA.  

  1. 1Features
  2. 2Applications
  3. 3Description
    1.     Device Images
      1.      AFE2257 Block Diagram
  4. 4Revision History
  5. 5Device and Documentation Support
    1. 5.1 Documentation Support
      1. 5.1.1 Related Documentation
    2. 5.2 Trademarks
    3. 5.3 Electrostatic Discharge Caution
    4. 5.4 Glossary
  6. 6Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Features

  • 256 Channels
  • On-chip, 16-bit ADC
  • Photodiode short immunity
  • High performance:
    • Noise: < 600 electrons
    • Low correlated noise
    • Full-channel integral nonlinearity:
      ±2 LSB with internal 16-Bit ADC
    • Scan time: < 20 µs to > 250 µs
  • Integration:
    • Programmable full-scale input charge range:
      < 1 pC to > 25 pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
  • Simple power-supply scheme:
    • AVDD1 = 1.85 V
    • AVDD2 = 3.3 V or 4.75 V
  • Low power consumption
  • Nap and total power-down modes
  • Pin compatible to AFE2256