4 Revision History
Changes from B Revision (November 2014) to C Revision
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Changed CE to CE for bq24297 in Pin FunctionsGo
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Changed VREF to VREGN in Figure 18 Go
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Changed 20°C to –20°C and VREF to VREGN in Figure 19 Go
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Changed Equation 1 Go
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Changed Bit 3 RESET from 1 to 0 in Table 12 Go
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Changed Bit 2 RESET from 1 to 0 in Table 12 Go
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Changed 0 to 1 for REG05 Bit 2 Reset in Table 13 Go
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Changed 1 to 0 for REG05 Bit 1 Reset in Table 13 Go
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Changed DPDM_EN to IINDET_EN in Table 15Go
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Changed D+/D– to Input current limit in Table 15Go
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Added note to Figure 40 Go
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Added note to Figure 41 Go
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Changed last paragraph in Output Capacitor sectionGo
Changes from A Revision (October 2013) to B Revision
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Added Handling Rating table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section.Go
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Changed front page schematicGo
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Changed REG01[4] = 1 to REG01[5] = 1 in OTG descriptionGo
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Added (10kΩ NTC thermister only) to QON descriptionGo
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Added ESD information to Handling Ratings Go
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Changed ICHG = 1792 mA in IICHG_REG_ACC test conditionsGo
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Changed falling to rising in VHTFGo
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Changed VHTF TYP to 47.2% Go
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Changed Input high threshold (OTG) MIN to 1.1 VGo
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Changed Table 3 Go
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Changed Figure 15 Go
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Changed RT1 = 5.25 kΩ Go
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Deleted and LSFET from Voltage and Current Monitoring in Buck Mode descriptionGo
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Deleted HSFET and from Voltage and Current Monitoring in Boost Mode descriptionGo
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Changed text in Over-Current ProtectionGo
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Changed REG09[5] to REG09[3] in Battery Over-Voltage Protection (BATOVP) sectionGo
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Changed REG09 Bit 3 description 1 – Battery OVP Go
Changes from * Revision (September 2013) to A Revision
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Deleted H from bq24297 PART NUMBERGo