SLUSBK2I October   2013  – March 2022 BQ76920 , BQ76930 , BQ76940

PRODMIX  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Device Comparison Table
  6. Pin Configuration and Functions
    1. 6.1 Versions
    2. 6.2 BQ76920 Pin Diagram
    3. 6.3 BQ76930 Pin Diagram
    4. 6.4 BQ76940 Pin Diagram
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Subsystems
        1. 8.3.1.1 Measurement Subsystem Overview
          1. 8.3.1.1.1 Data Transfer to the Host Controller
          2. 8.3.1.1.2 14-Bit ADC
            1. 8.3.1.1.2.1 Optional Real-Time Calibration Using the Host Microcontroller
          3. 8.3.1.1.3 16-Bit CC
          4. 8.3.1.1.4 External Thermistor
          5. 8.3.1.1.5 Die Temperature Monitor
          6. 8.3.1.1.6 16-Bit Pack Voltage
          7. 8.3.1.1.7 System Scheduler
        2. 8.3.1.2 Protection Subsystem
          1. 8.3.1.2.1 Integrated Hardware Protections
          2. 8.3.1.2.2 Reduced Test Time
        3. 8.3.1.3 Control Subsystem
          1. 8.3.1.3.1 FET Driving (CHG AND DSG)
            1. 8.3.1.3.1.1 High-Side FET Driving
          2. 8.3.1.3.2 Load Detection
          3. 8.3.1.3.3 Cell Balancing
          4. 8.3.1.3.4 Alert
          5. 8.3.1.3.5 Output LDO
        4. 8.3.1.4 Communications Subsystem
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 SHIP Mode
    5. 8.5 Register Maps
      1. 8.5.1 Register Details
      2. 8.5.2 Read-Only Registers
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Device Timing
      2. 9.1.2 Random Cell Connection
      3. 9.1.3 Power Pin Diodes
      4. 9.1.4 Alert Pin
      5. 9.1.5 Sense Inputs
      6. 9.1.6 TSn Pins
      7. 9.1.7 Unused Pins
      8. 9.1.8 Configuring Alternative Cell Counts
    2. 9.2 Typical Applications
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Step-by-Step Design Procedure
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Third-Party Products Disclaimer
    2. 12.2 Documentation Support
    3. 12.3 Related Links
    4. 12.4 Receiving Notification of Documentation Updates
    5. 12.5 Trademarks
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Communications Subsystem

The AFE implements a standard 100-kHz I2C interface and acts as a slave device. The I2C device address is 7-bits and is factory programmed. Consult the Device Comparison Table (Section 5) of this data sheet for more information.

A write transaction is shown in Figure 8-3. Block writes are allowed by sending additional data bytes before the Stop. The I2C block will auto-increment the register address after each data byte.

When enabled, the CRC is calculated as follows:

  • In a single-byte write transaction, the CRC is calculated over the slave address, register address, and data.
  • In a block write transaction, the CRC for the first data byte is calculated over the slave address, register address, and data. The CRC for subsequent data bytes is calculated over the data byte only.

The CRC polynomial is x8 + x2 + x + 1, and the initial value is 0.

When the slave detects a bad CRC, the I2C slave will NACK the CRC, which causes the I2C slave to go to an idle state.

GUID-53C3BE3C-6E9A-4270-821B-3865A4E1766A-low.gifFigure 8-3 I2C Write

Figure 8-4 shows a read transaction using a Repeated Start.

GUID-E6C6815F-1129-4A6D-94A3-95CEA682DC4A-low.gifFigure 8-4 I2C Read with Repeated Start

Figure 8-5 shows a read transaction where a Repeated Start is not used, for example if not available in hardware. For a block read, the master ACK’s each data byte except the last and continues to clock the interface. The I2C block will auto-increment the register address after each data byte.

When enabled, the CRC for a read transaction is calculated as follows:

  • In a single-byte read transaction, the CRC is calculated after the second start and uses the slave address and data byte.
  • In a block read transaction, the CRC for the first data byte is calculated after the second start and uses the slave address and data byte. The CRC for subsequent data bytes is calculated over the data byte only.

The CRC polynomial is x8 + x2 + x + 1, and the initial value is 0.

When the master detects a bad CRC, the I2C master will NACK the CRC, which causes the I2C slave to go to an idle state.

GUID-26E67831-80E5-43A9-A352-564F106D2194-low.gifFigure 8-5 I2C Read Without Repeated Start