SLUSEG7A December   2021  – June 2022 BQ77207

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Information
    5. 8.5 DC Characteristics
    6. 8.6 Timing Requirements
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Voltage Fault Detection
      2. 9.3.2 Open Wire Fault Detection
      3. 9.3.3 Temperature Fault Detection
      4. 9.3.4 Oscillator Health Check
      5. 9.3.5 Sense Positive Input for Vx
      6. 9.3.6 Output Drive, COUT and DOUT
      7. 9.3.7 The LATCH Function
      8. 9.3.8 Supply Input, VDD
    4. 9.4 Device Functional Modes
      1. 9.4.1 NORMAL Mode
      2. 9.4.2 FAULT Mode
      3. 9.4.3 Customer Test Mode
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Design Requirements
      2. 10.1.2 Detailed Design Procedure
        1. 10.1.2.1 Cell Connection Sequence
    2. 10.2 Systems Example
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Third-Party Products Disclaimer
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Temperature Fault Detection

In the BQ77207 device, the TS pin is ratiometrically monitored with an internal pull up resistance RNTC. Overtemperature is detected by evaluating the TS input voltage to determine the external resistance falls below a protection resistance, ROT_EXT. If the resistance falls below the programmed OT value, a timer circuit is activated. When the timer expires, the COUT and DOUT pins go from inactive to active state. The timer is reset if the resistance rises above the recovery threshold (ROT + ROT_HYS). If external capacitance is added to the TS pin, it needs to be within the spec limit shown in recommended operating conditions.

Note:

Texas Instruments does not recommend adding an external capacitor to the TS pin. The capacitance on this pin will affect the TS measurement accuracy if greater than CTS.