SLUSCU0I March   2018  – September 2020 BQ77915


  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Device Comparison Table
  7. Pin Configuration and Functions
    1.     Pin Functions
  8. Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Table
    5. 8.5 Electrical Characteristics
    6. 8.6 Typical Characteristics
  9. Detailed Description
    1. 9.1 Overview
      1. 9.1.1 Device Functionality Summary
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1  Protection Summary
      2. 9.3.2  Fault Operation
        1.  Operation in OV
        2.  Operation in UV
        3.  Operation in OW
        4.  Operation in OCD1
        5.  Operation in OCD2
        6.  Programming the OCD1/2 Delay Using the OCDP Pin
        7.  Operation in SCD
        8.  Operation in OCC
        9.  Overcurrent Recovery Timer
        10. Load Detection and Load Removal Detection
        11. Operation in OTC
        12. Operation in OTD
        13. Operation in UTC
        14. Operation in UTD
      3. 9.3.3  Protection Response and Recovery Summary
      4. 9.3.4  Cell Balancing
      5. 9.3.5  HIBERNATE Mode Operation
      6. 9.3.6  Configuration CRC Check and Comparator Built-In-Self-Test
      7. 9.3.7  Fault Detection Method
        1. Filtered Fault Detection
      8. 9.3.8  State Comparator
      9. 9.3.9  DSG FET Driver Operation
      10. 9.3.10 CHG FET Driver Operation
      11. 9.3.11 External Override of CHG and DSG Drivers
      12. 9.3.12 Configuring 3-Series, 4-Series, or 5-Series Modes
      13. 9.3.13 Stacking Implementations
      14. 9.3.14 Zero-Volt Battery Charging Inhibition
    4. 9.4 Device Functional Modes
      1. 9.4.1 Power Modes
        1. Power On Reset (POR)
        2. NORMAL Mode
        3. FAULT Mode
        4. HIBERNATE Mode
        5. SHUTDOWN Mode
        6. Customer Fast Production Test Modes
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Recommended System Implementation
        1. CHG and DSG FET Rise and Fall Time
        2. Protecting CHG and LD
        3. Protecting the CHG FET
        4. Using Load Detect for UV Fault Recovery
        5. Temperature Protection
        6. Adding RC Filters to the Sense Resistor
        7. Using the State Comparator in an Application
          1. Examples
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. Design Example
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Configuration CRC Check and Comparator Built-In-Self-Test

To improve reliability, the device has a built-in CRC check for all the factory-programmable configurations, such as the thresholds and delay time settings. When the device is set up in the factory, a corresponding CRC value is also programmed to the memory. During normal operation, the device compares the configuration setting against the programmed CRC periodically. A CRC error will reset the digital circuitry and increment the CRC fault counter. The digital reset forces the device to reload the configuration as an attempt to correct the configurations. A correct CRC check reduces the CRC fault counter. Three CRC fault counts will turn off both the CHG and DSG drivers. If FETs are opened due to a CRC error, only a POR can recover the FET state and reset the CRC fault.

In addition to the CRC check, the device also has built-in-self-test (BIST) on the comparators. The BIST runs in a scheduler, and each comparator is checked for a period of time. If a fault is detected for the entire check period, the particular comparator is considered at fault, and the CHG and DSG FETs are turned off. The BIST continues to run by the scheduler even if a BIST fault is detected. If the next BIST result is good, the FET driver resumes normal operation.

The CRC check and BIST check do not affect the normal operation of the device. However, there is not specific indication when a CRC or BIST error is detected besides turning off the CHG and DSG drivers. If there is no voltage, current, or temperature fault condition present, but CHG and DSG drivers remain off, it is possible either CRC or BIST error is detected. Users can POR the device to reset the device.