SNAS811 July   2020  – May  CDCE6214

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Application Example CDCE6214
  4. 4 Revision History
  5. 5 Description (cont.)
  6. 6 Pin Configuration and Functions
    1.     Pin Functions G = Ground, P = Power I = Input, I/O = Input/Output, O = Output I, RPUPD = Input with Resistive Pull-up and Pull-down I, RPU = Input with Resistive Pull=up I/O, RPU = Input/Output with resistive pull-up
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  EEPROM Characteristics
    6. 7.6  Reference Input, Single-Ended Characteristics
    7. 7.7  Reference Input, Differential Characteristics
    8. 7.8  Reference Input, Crystal Mode Characteristics
    9. 7.9  General-Purpose Input Characteristics
    10. 7.10 Triple Level Input Characteristics
    11. 7.11 Logic Output Characteristics
    12. 7.12 Phase Locked Loop Characteristics
    13. 7.13 Closed-Loop Output Jitter Characteristics
    14. 7.14 Input and Output Isolation
    15. 7.15 Buffer Mode Characteristics
    16. 7.16 PCIe Spread Spectrum Generator
    17. 7.17 LVCMOS Output Characteristics
    18. 7.18 LP-HCSL Output Characteristics
    19. 7.19 LVDS Output Characteristics
    20. 7.20 Output Synchronization Characteristics
    21. 7.21 Power-On Reset Characteristics
    22. 7.22 I2C-Compatible Serial Interface Characteristics
    23. 7.23 Timing Requirements, I2C-Compatible Serial Interface
    24. 7.24 Power Supply Characteristics
    25. 7.25 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Reference Inputs
    2. 8.2 Outputs
    3. 8.3 Serial Interface
    4. 8.4 PSNR Test
    5. 8.5 Clock Interfacing and Termination
      1. 8.5.1 Reference Input
      2. 8.5.2 Outputs
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Reference Block
        1. 9.3.1.1 Zero Delay Mode, Internal and External Path
      2. 9.3.2 Phase-Locked Loop (PLL)
        1. 9.3.2.1 PLL Configuration and Divider Settings
        2. 9.3.2.2 Spread Spectrum Clocking
        3. 9.3.2.3 Digitally-Controlled Oscillator/ Frequency Increment and Decrement - Serial Interface Mode and GPIO Mode
      3. 9.3.3 Clock Distribution
        1. 9.3.3.1 Glitchless Operation
        2. 9.3.3.2 Divider Synchronization
        3. 9.3.3.3 Global and Individual Output Enable
      4. 9.3.4 Power Supplies and Power Management
      5. 9.3.5 Control Pins
    4. 9.4 Device Functional Modes
      1. 9.4.1 Operation Modes
        1. 9.4.1.1 Fall-Back Mode
        2. 9.4.1.2 Pin Mode
        3. 9.4.1.3 Serial Interface Mode
    5. 9.5 Programming
      1. 9.5.1 I2C Serial Interface
      2. 9.5.2 EEPROM
        1. 9.5.2.1 EEPROM - Cyclic Redundancy Check
        2. 9.5.2.2 Recommended Programming Procedure
        3. 9.5.2.3 EEPROM Access
          1. 9.5.2.3.1 Register Commit Flow
          2. 9.5.2.3.2 Direct Access Flow
        4. 9.5.2.4 Register Bits to EEPROM Mapping
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
    1. 11.1 Power-Up Sequence
    2. 11.2 Decoupling
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Examples
  13. 13Device and Documentation Support
    1. 13.1 Device Support
      1. 13.1.1 Development Support
      2. 13.1.2 Device Nomenclature
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.23 Timing Requirements, I2C-Compatible Serial Interface

VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPW_G Pulse Width of Suppressed Glitches 50 ns
fSCL SCL Clock Frequency Standard 100 kHz
fSCL SCL Clock Frequency Fast-mode 400 kHz
tSU_STA Setup Time Start Condition SCL=VIH before SDA=VIL 0.6 µs
tH_STA Hold Time Start Condition SCL=VIL after SCL=VIL After this time, the first clock edge is generated. 0.6 µs
tSU_SDA Setup Time Data SDA valid after SCL=VIL, fSCL=100 kHz 250 ns
tSU_SDA Setup Time Data SDA valid after SCL=VIL, fSCL=400 kHz 100 ns
tH_SDA Hold Time Data(1) SDA valid before SCL=VIH 0(2) (3) µs
tVD_SDA Valid Data or Acknowledge Time fSCL=100 kHz(3) 3.45 µs
tVD_SDA Valid Data or Acknowledge Time fSCL=400 kHz(2) 0.9 µs
tPWH_SCL Pulse Width High, SCL fSCL=100 kHz 4.0 µs
tPWH_SCL Pulse Width High, SCL fSCL=400 kHz 0.6 µs
tPWL_SCL Pulse Width Low, SCL fSCL=100 kHz 4.7 µs
tPWL_SCL Pulse Width Low, SCL fSCL=400 kHz 1.3 µs
tIR Input Rise Time 300 ns
tIF Input Fall Time 300 ns
tOF Output Fall Time 10 pF ≤ COUT ≤ 400 pF 250 ns
tSU_STOP Setup Time Stop Condition 0.6 µs
tBUS Bus-Free Time Time between a Stop and a Start condition 1.3 µs
(1) tH_SDA is the data hold time that is measured from the falling edge of SCL, applies to data in transmission and the acknowledge.
(2) A device must internally provide a hold time of at least 300 ns for the SDA signal (with respect to the VIH(min) of the SCL signal) to bridge the undefined region of the falling edge of SCL.
(3) The maximum tH_SDA could be 3.45 μs and 0.9 μs for Standard-mode and Fast-mode, but must be less than the maximum of tVD_SDA by a transition time. This maximum must only be met if the device does not stretch the LOW period (tPWL_SCL) of the SCL signal. If the clock stretches the SCL, the data must be valid by the setup time before it releases the clock.