SLAS748F March 2011 – August 2015 DAC3482
The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
In 2013, TI has enhanced production test coverage for the on-chip phase-locked loop. The purpose of the production test coverage enhancement is to increase the DAC operating speed and allow the phase-locked loop to stay locked throughout the recommended range over the operating free-air temperature specification using only one pll_vco(5:0) setting instead of possible adjustments over temperature. This new specification reduces alarm checking and pll_vco(5:0) adjustment overhead if the phase-locked loop is used in the end application.
The tested devices will have updated date code. For the RKD package option, the tested devices will have date code that start 36 or later. For the ZAY package option, the tested devices will have date code that start 3B or later. Refer to Figure 103 for the location of the date code for the respective packages.