DLPS026F August   2012  – June 2019 DLP7000

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Simplified Application
  4. Revision History
  5. Description (continued)
  6. Pin Configuration and Functions
    1.     Pin Functions
  7. Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  Storage Conditions
    3. 7.3  ESD Ratings
    4. 7.4  Recommended Operating Conditions
    5. 7.5  Thermal Information
    6. 7.6  Electrical Characteristics
    7. 7.7  LVDS Timing Requirements
    8. 7.8  LVDS Waveform Requirements
    9. 7.9  Serial Control Bus Timing Requirements
    10. 7.10 Systems Mounting Interface Loads
    11. 7.11 Micromirror Array Physical Characteristics
    12. 7.12 Micromirror Array Optical Characteristics
    13. 7.13 Window Characteristics
    14. 7.14 Chipset Component Usage Specification
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 DLPC410 Chipset DMD Features
        1. 8.3.1.1 DLPC410 - Digital Controller for DLP Discovery 4100 Chipset
        2. 8.3.1.2 DLPA200 - DMD Micromirror Driver
        3. 8.3.1.3 DLPR410 - PROM for DLP Discovery 4100 Chipset
        4. 8.3.1.4 DLP7000 - DLP 0.7 XGA 2xLVDS Type-A DMD
          1. 8.3.1.4.1 DLP7000 XGA Chip Set Interfaces
            1. 8.3.1.4.1.1 DLPC410 Interface Description
              1. 8.3.1.4.1.1.1 DLPC410 IO
              2. 8.3.1.4.1.1.2 Initialization
              3. 8.3.1.4.1.1.3 DMD Device Detection
              4. 8.3.1.4.1.1.4 Power Down
          2. 8.3.1.4.2 DLPC410 to DMD Interface
            1. 8.3.1.4.2.1 DLPC410 to DMD IO Description
            2. 8.3.1.4.2.2 Data Flow
          3. 8.3.1.4.3 DLPC410 to DLPA200 Interface
            1. 8.3.1.4.3.1 DLPA200 Operation
            2. 8.3.1.4.3.2 DLPC410 to DLPA200 IO Description
          4. 8.3.1.4.4 DLPA200 to DLP7000 Interface
            1. 8.3.1.4.4.1 DLPA200 to DLP7000 Interface Overview
        5. 8.3.1.5 Measurement Conditions
    4. 8.4 Device Functional Modes
      1. 8.4.1 DMD Operation
        1. 8.4.1.1 Single Block Mode
        2. 8.4.1.2 Dual Block Mode
        3. 8.4.1.3 Quad Block Mode
        4. 8.4.1.4 Global Mode
    5. 8.5 Optical Interface and System Image Quality Considerations
      1. 8.5.1 Optical Interface and System Image Quality
      2. 8.5.2 Numerical Aperture and Stray Light Control
      3. 8.5.3 Pupil Match
      4. 8.5.4 Illumination Overfill
    6. 8.6 Micromirror Array Temperature Calculation
      1. 8.6.1 Package Thermal Resistance
      2. 8.6.2 Case Temperature
      3. 8.6.3 Micromirror Array Temperature Calculation - Lumens Based (typically used for display applications)
      4. 8.6.4 Micromirror Array Temperature Calculation - Power Density Based
    7. 8.7 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 8.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 8.7.2 Landed Duty Cycle and Useful Life of the DMD
      3. 8.7.3 Landed Duty Cycle and Operational DMD Temperature
      4. 8.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Device Description
      3. 9.2.3 Detailed Design Procedure
  10. 10Power Supply Recommendations
    1. 10.1 DMD Power-Up and Power-Down Procedures
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Impedance Requirements
      2. 11.1.2 PCB Signal Routing
      3. 11.1.3 DMD Interface
        1. 11.1.3.1 Trace Length Matching
      4. 11.1.4 DLP7000 Decoupling
        1. 11.1.4.1 Decoupling Capacitors
      5. 11.1.5 VCC and VCC2
      6. 11.1.6 DMD Layout
      7. 11.1.7 DLPA200
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Device Nomenclature
      2. 12.1.2 Device Marking
    2. 12.2 Documentation Support
      1. 12.2.1 Related Documents
    3. 12.3 Related Links
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Decoupling Capacitors

Decoupling capacitors should be placed to minimize the distance from the decoupling capacitor to the supply and ground pin of the component. It is recommended that the placement of and routing for the decoupling capacitors meet the following guidelines:

  • The supply voltage pin of the capacitor should be located close to the device supply voltage pin(s). The decoupling capacitor should have vias to ground and voltage planes. The device can be connected directly to the decoupling capacitor (no via) if the trace length is less than 0.1 inch. Otherwise, the component should be tied to the voltage or ground plane through separate vias.
  • The trace lengths of the voltage and ground connections for decoupling capacitors and components should be less than 0.1 inch to minimize inductance.
  • The trace width of the power and ground connection to decoupling capacitors and components should be as wide as possible to minimize inductance.
  • Connecting decoupling capacitors to ground and power planes through multiple vias can reduce inductance and improve noise performance.
  • Decoupling performance can be improved by utilizing low ESR and low ESL capacitors.