DLPS038E July   2014  – August 2019 DLPC3430 , DLPC3435

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Typical, Simplified System
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions – Test Pins and General Control
    2.     Pin Functions – Parallel Port Input
    3.     Pin Functions – DSI Input Data and Clock
    4.     Pin Functions – DMD Reset and Bias Control
    5.     Pin Functions – DMD Sub-LVDS Interface
    6.     Pin Functions – Peripheral Interface
    7.     Pin Functions – GPIO Peripheral Interface
    8.     Pin Functions – Clock and PLL Support
    9.     Pin Functions – Power and Ground
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Electrical Characteristics
    6. 6.6  Pin Electrical Characteristics
    7. 6.7  Internal Pullup and Pulldown Electrical Characteristics
    8. 6.8  DMD Sub-LVDS Interface Electrical Characteristics
    9. 6.9  DMD Low-Speed Interface Electrical Characteristics
    10. 6.10 System Oscillator Timing Requirements
    11. 6.11 Power Supply and Reset Timing Requirements
    12. 6.12 Parallel Interface Frame Timing Requirements
    13. 6.13 Parallel Interface General Timing Requirements
    14. 6.14 BT656 Interface General Timing Requirements
    15. 6.15 DSI Host Timing Requirements
    16. 6.16 Flash Interface Timing Requirements
    17. 6.17 Other Timing Requirements
    18. 6.18 DMD Sub-LVDS Interface Switching Characteristics
    19. 6.19 DMD Parking Switching Characteristics
    20. 6.20 Chipset Component Usage Specification
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Input Source Requirements
        1. 7.3.1.1 Supported Resolution and Frame Rates
        2. 7.3.1.2 3D Display
        3. 7.3.1.3 Parallel Interface
          1. 7.3.1.3.1 PDATA Bus – Parallel Interface Bit Mapping Modes
        4. 7.3.1.4 DSI Interface
      2. 7.3.2 Device Startup
      3. 7.3.3 SPI Flash
        1. 7.3.3.1 SPI Flash Interface
        2. 7.3.3.2 SPI Flash Programming
      4. 7.3.4 I2C Interface
      5. 7.3.5 Content Adaptive Illumination Control (CAIC)
      6. 7.3.6 Local Area Brightness Boost (LABB)
      7. 7.3.7 3D Glasses Operation
      8. 7.3.8 Test Point Support
      9. 7.3.9 DMD Interface
        1. 7.3.9.1 Sub-LVDS (HS) Interface
    4. 7.4 Device Functional Modes
    5. 7.5 Programming
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
  9. Power Supply Recommendations
    1. 9.1 PLL Design Considerations
    2. 9.2 System Power-Up and Power-Down Sequence
    3. 9.3 Power-Up Initialization Sequence
    4. 9.4 DMD Fast Park Control (PARKZ)
    5. 9.5 Hot Plug I/O Usage
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1  PLL Power Layout
      2. 10.1.2  Reference Clock Layout
        1. 10.1.2.1 Recommended Crystal Oscillator Configuration
      3. 10.1.3  DSI Interface Layout
      4. 10.1.4  Unused Pins
      5. 10.1.5  DMD Control and Sub-LVDS Signals
      6. 10.1.6  Layer Changes
      7. 10.1.7  Stubs
      8. 10.1.8  Terminations
      9. 10.1.9  Routing Vias
      10. 10.1.10 Thermal Considerations
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Third-Party Products Disclaimer
      2. 11.1.2 Device Nomenclature
        1. 11.1.2.1 Device Markings
        2. 11.1.2.2 Video Timing Parameter Definitions
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Related Links
    4. 11.4 Receiving Notification of Documentation Updates
    5. 11.5 Community Resources
    6. 11.6 Trademarks
    7. 11.7 Electrostatic Discharge Caution
    8. 11.8 Glossary
  12. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Package Option Addendum
      1. 12.1.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)

Sub-LVDS (HS) Interface

The DLP2010 (.2 WVGA) DMD does not require all of the available output data lanes of the controller. Internal software selection allows the controller to support multiple DMD interface swap configurations. These options can improve board layout by remapping specific combinations of DMD interface lines to other DMD interface lines as needed. Table 12 shows the four options available for the DLP2010 DMD. Leave any unused DMD signal pairs unconnected on the final board design.

Table 12. DLP2010 (.2 WVGA) DMD – Controller to 4-Lane DMD Pin Mapping Options

DLP2010 4-LANE DMD ROUTING OPTIONS DMD PINS
OPTION 1 OPTION 2 OPTION 3 OPTION 4
HS_WDATA_D_P
HS_WDATA_D_N
HS_WDATA_E_P
HS_WDATA_E_N
HS_WDATA_H_P
HS_WDATA_H_N
HS_WDATA_A_P
HS_WDATA_A_N
Input DATA_P_0
Input DATA_N_0
HS_WDATA_C_P
HS_WDATA_C_N
HS_WDATA_F_P
HS_WDATA_F_N
HS_WDATA_G_P
HS_WDATA_G_N
HS_WDATA_B_P
HS_WDATA_B_N
Input DATA_P_1
Input DATA_N_1
HS_WDATA_F_P
HS_WDATA_F_N
HS_WDATA_C_P
HS_WDATA_C_N
HS_WDATA_B_P
HS_WDATA_B_N
HS_WDATA_G_P
HS_WDATA_G_N
Input DATA_P_2
Input DATA_N_2
HS_WDATA_E_P
HS_WDATA_E_N
HS_WDATA_D_P
HS_WDATA_D_N
HS_WDATA_A_P
HS_WDATA_A_N
HS_WDATA_H_P
HS_WDATA_H_N
Input DATA_P_3
Input DATA_N_3
DLPC3430 DLPC3435 tim_DMD_subLVDS_dlps000.gifFigure 26. DLP2010 (.2 WVGA) DMD Interface Example (Option 1 and 2)

The sub-LVDS high-speed interface waveform quality and timing on the DLPC34xx controller depends on the total length of the interconnect system, the spacing between traces, the characteristic impedance, etch losses, and how well matched the lengths are across the interface. Thus, ensuring positive timing margin requires attention to many factors.

In an attempt to minimize the signal integrity analysis that would otherwise be required, the DMD Control and Sub-LVDS Signals layout section is provided as a reference of an interconnect system that satisfy both waveform quality and timing requirements (accounting for both PCB routing mismatch and PCB signal integrity). Variation from these recommendations may also work, but should be confirmed with PCB signal integrity analysis or lab measurements.