5 Revision History
Changes from I Revision (January 2014) to J Revision
-
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
Changes from H Revision (November 2013) to I Revision
-
Added IOCP to ELECTRICAL CHARACTERISTICSGo
-
Changed Figure 5Go
Changes from G Revision (October 2013) to H Revision
-
Changed maximum junction temperature from 190°C to 150°CGo
-
Changed VTRP description/test conditionsGo
-
Changed Protection Circuitry sectionGo
-
Changed Note in SENSE sectionGo