SNLS299I May   2008  – June 2020 DS90LV028AQ-Q1

UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Functional Diagram
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Descriptions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
    7. 6.7 Typical Performance Curves
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Functional Block Diagram
    2. 8.2 Device Functional Modes
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Detailed Design Procedure
        1. 9.2.1.1 Power Decoupling Recommendations
        2. 9.2.1.2 Termination
        3. 9.2.1.3 Input Failsafe Biasing
        4. 9.2.1.4 Probing LVDS Transmission Lines
        5. 9.2.1.5 Cables and Connectors, General Comments
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Differential Traces
      2. 10.1.2 PC Board Considerations
  11. 11Device and Documentation Support
    1. 11.1 Device Support
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Revision History

Changes from H Revision (May 2019) to I Revision

  • Deleted DQF from Device Information tableGo
  • Deleted DQF package option Go

Changes from G Revision (November 2018) to H Revision

  • Deleted the Thermal Pad from the DQF packageGo
  • Changed VCC 0.3 To: VCC + 0.3 in the Absolute Maximum Ratings tableGo
  • Added NOTE: "These parameters are specified by design."Go

Changes from F Revision (August 2018) to G Revision

  • Changed the Pin image views Go
  • Changed the Pin Descriptions format Go

Changes from E Revision (April 2013) to F Revision

  • Added Applications list, Device Information table, ESD Ratings table, Device Functional Modes, Application and Implementation section, Layout section, Device and Documentation Support section.Go
  • Added the DQF package to the data sheet Go

Changes from D Revision (April 2013) to E Revision

  • Changed layout of National Data Sheet to TI formatGo