SNLS231P September 2006 – August 2024 DS90UR124-Q1 , DS90UR241-Q1
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| tLLHT | LVDS Low-to-High Transition Time | RL = 100Ω, VODSEL = L, CL = 10pF to GND, Figure 5-3 | 245 | 550 | ps | |
| tLHLT | LVDS High-to-Low Transition Time | 264 | 550 | ps | ||
| tDIS | DIN (0:23) Setup to TCLK | RL = 100Ω, CL = 10pF to GND Figure 5-5 | 4 | ns | ||
| tDIH | DIN (0:23) Hold from TCLK | 4 | ns | |||
| tHZD | DOUT ± HIGH to Tri-state Delay | RL = 100Ω, CL = 10pF to GND Figure 5-6 | 10 | 15 | ns | |
| tLZD | DOUT ± LOW to Tri-state Delay | 10 | 15 | ns | ||
| tZHD | DOUT ± Tri-state to HIGH Delay | 75 | 150 | ns | ||
| tZLD | DOUT ± Tri-state to LOW Delay | 75 | 150 | ns | ||
| tPLD | Serializer PLL Lock Time | RL = 100Ω | 10 | ms | ||
| tSD | Serializer Delay | RL = 100Ω, PRE = OFF, RAOFF = L, TRFB = H, Figure 5-8 | 3.5T+2 | 3.5T+10 | ns | |
| RL = 100Ω, PRE = OFF, RAOFF = L, TRFB = L, Figure 5-8 | 3.5T+2 | 3.5T+10 | ||||
| TxOUT_E_O | TxOUT_Eye_Opening. TxOUT_E_O centered on (tBIT/)2 | 5MHz–43MHz, RL = 100Ω, CL = 10pF to GND, RANDOM pattern Figure 5-9 | 0.76 | 0.84 | UI | |