SNVS585M September   2008  – October 2020 LM22678 , LM22678-Q1

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 Handling Ratings: LM22678
    3. 6.3 Handling Ratings: LM22678-Q1
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Thermal Information
    6. 6.6 Electrical Characteristics
    7. 6.7 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Precision Enable and UVLO
      2. 7.3.2 Soft Start
      3. 7.3.3 Bootstrap Supply
      4. 7.3.4 Internal Loop Compensation
    4. 7.4 Device Functional Modes
      1. 7.4.1 Shutdown Mode
      2. 7.4.2 Active Mode
      3. 7.4.3 Current Limit
      4. 7.4.4 Thermal Protection
      5. 7.4.5 Duty-Cycle Limits
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Output Voltage Divider Selection
      2. 8.1.2 Power Diode
    2. 8.2 Typical Applications
      1. 8.2.1 Typical Buck Regulator Application
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 External Components
            1. 8.2.1.2.1.1 Inductor
          2. 8.2.1.2.2 Input Capacitor
          3. 8.2.1.2.3 Output Capacitor
          4. 8.2.1.2.4 Bootstrap Capacitor
        3. 8.2.1.3 Application Curves
  9. Layout
    1. 9.1 Layout Guidelines
    2. 9.2 Layout Example
    3. 9.3 Thermal Considerations
  10. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Support Resources
    3. 10.3 Receiving Notification of Documentation Updates
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 Glossary

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.