5 Revision History

Changes from January 22, 2019 to December 9, 2019

• Changed the note that begins "Supply voltage changes faster than 0.2 V/µs can trigger a BOR reset..." in Section 8.3, Recommended Operating Conditions Go
• Added the note that begins "TI recommends that power to the DVCC pin must not exceed the limits..." in Section 8.3, Recommended Operating Conditions Go
• Changed the note that begins "A capacitor tolerance of ±20% or better is required..." in Section 8.3, Recommended Operating Conditions Go
• Added the note "See MSP430 32-kHz Crystal Oscillators for details on crystal section, layout, and testing" to Section 8.12.3.1, XT1 Crystal Oscillator (Low Frequency) Go
• Changed the note that begins "Requires external capacitors at both terminals..." in Section 8.12.3.1, XT1 Crystal Oscillator (Low Frequency) Go
• Added the t_(int) parameter in Section 8.12.4.1, Digital Inputs Go
• Added the t_TA,capparameter in Section 8.12.5.1, Timer_A Go
• Corrected the test conditions for the R_I,MUX parameter in Section 8.12.7.1, ADC, Power Supply and Input Range Conditions Go
• Added the note that begins "t_Sample = ln(2ⁿ⁺¹) × τ ..." in Section 8.12.7.2, ADC, 10-Bit Timing Parameters Go

Changes from August 30, 2018 to January 21, 2019

• Throughout the document, changed Modulation Oscillator (MODOSC) to Modulation Oscillator Clock (MODCLK) Go
• Added "or memory corruption" in table that starts "Stresses beyond those listed..." of Section 8.1, Absolute Maximum Ratings Go
• Added note of VLO clock frequency shift in LPM3 and LPM4 mode in Section 8.12.3.4, Internal Very-Low-Power Low-Frequency Oscillator (VLO) Go
• Changed from R_I to R_I,MUX in Section 8.12.7.1, ADC, Power Supply and Input Range Conditions Go
• Added R_I,Misc TYP value 34kΩ in Section 8.12.7.1, ADC, Power Supply and Input Range Conditions Go
• Removed ADCDIV from the conversion time formula because ADCCLK is after division in Section 8.12.7.2, ADC, 10-Bit Timing Parameters Go
• Added formula for R_I calculation in Section 8.12.7.2, ADC, 10-Bit Timing Parameters Go
• Remove description of "±3°C" in table note that starts "The device descriptor structure ..." of Section 8.12.7.3, ADC, 10-Bit Linearity Parameters Go
• Add "10b" for ADCSSEL bit in Table 9-6, Clock Distribution Go
• Added "Clock Distribution Block Diagram" in Section 9.9.2, Clock System (CS) and Clock Distribution Go
• Corrected bitfield from IRDSEL to IRDSSEL in Section 9.9.8, Timers (Timer0_A3, Timer1_A3), in the description that starts "The interconnection of Timer0_A3 and ..."Go
• Corrected the ADCINCHx column heading in Table 9-12, ADC Channel Connections Go
• Added word "Sensor" in Table 9-27, Device Descriptors Go
• Added word "Sensor" in Table 9-27, Device Descriptors Go

Changes from August 15, 2015 to August 29, 2018

• Editorial changes and additional information in Section 1, Features, Section 2, Applications, and Section 3, Description Go
• Updated Section 6.1, Related Products Go
• Added note to V_SVSH- and V_SVSH+ parameters in Section 8.12.1.1, PMM, SVS and BOR Go
• Changed all instances of "bootstrap loader" to "bootloader"Go
• Updates to text and figure in Section 11.2, Device Nomenclature Go

Changes from December 20, 2014 to August 14, 2015

• Changed "Standby Mode" current consumption from 770 nA to 1 µA Go
• Added Section 8.2, ESD Ratings Go
• Added I_{LPM3.5, LCD, CP} TYP values at –40°C (0.90 µA) and at 85°C (1.27 µA)Go
• Added the paragraph that starts "The graphs in this section..."Go
• Changed all graphs in Section 8.9, Typical Characteristics, Low-Power Mode Supply Currents, for new measurements Go
• Added V_{REF, 1.2V} parameter to Section 8.12.1.1, PMM, SVS and BOR Go
• Changed t_STE,LEAD MIN value at 2 V from 40 ns to 50 nsGo
• Changed t_STE,LEAD MIN value at 3 V from 24 ns to 45 nsGo
• Changed t_VALID,SO MAX value at 2 V from 55 ns to 65 nsGo
• Changed t_VALID,SO MAX value at 3 V from 30 ns to 40 nsGo
• Changed f_ADCOSC TYP value from 4.5 MHz to 5.0 MHzGo
• In Table 9-1, Operating Modes, changed the entry for "Power Consumption at 25°C, 3 V" in AM from 100 µA/MHz to 126 µA/MHzGo
• In Table 9-1, Operating Modes, added "with RTC only" to the entry for "Power Consumption at 25°C, 3 V" in LPM3.5Go
• In Table 9-2, Interrupt Sources, Flags, and Vectors, removed "FRAM access time error" (ACCTEIFG) from the "System NMI" row Go
• In Table 9-8, System Module Interrupt Vector Registers, changed the interrupt event in the SYSSNIV row with a VALUE of 06h from "ACCTEIFG access time error" to "Reserved"Go
• In Table 9-27, Device Descriptors, added note to "CRC value"Go

Changes from October 3, 2014 to December 19, 2014

• Moved T_stg to Absolute Maximum Ratings table and added note (3)Go
• Changed link to BSL user's guide in Section 9.4 Go
• Added note (1) to Table 9-6 Go
• Changed the values of ADC Calibration Tag and ADC Calibration Length in the ADC Calibration rowGo
• Added Calibration Tag, Calibration Length, and 1.5-V Reference in the Reference and DCO Calibration rowGo
• Added row for BSL memory to Table 9-28 Go