SBOS566C June   2017  – October 2018 OPA1692

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Preamplifier for 3-Wire Electret Microphones
      2.      THD + N vs Frequency (3 VRMS, 2-kΩ Load)
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions: OPA1692
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA1692
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Distortion Reduction
      2. 7.3.2 Phase Reversal Protection
      3. 7.3.3 Electrical Overstress
    4. 7.4 Device Functional Modes
      1. 7.4.1 Operating Voltage
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitive Loads
      2. 8.1.2 Noise Performance
      3. 8.1.3 Basic Noise Calculations
      4. 8.1.4 EMI Rejection
      5. 8.1.5 EMIRR +IN Test Configuration
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Other Application Examples
      1. 8.3.1 Two-Wire Electret Microphone Preamplifier
      2. 8.3.2 Battery-Powered Preamplifier for Professional Microphones
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
    3. 10.3 Power Dissipation
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
        1. 11.1.1.1 TINA-TI™ (Free Software Download)
        2. 11.1.1.2 DIP Adapter EVM
        3. 11.1.1.3 Universal Operational Amplifier EVM
        4. 11.1.1.4 Smart Amplifier Speaker Characterization Board Evaluation Module
        5. 11.1.1.5 TI Precision Designs
        6. 11.1.1.6 WEBENCH Filter Designer
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Related Links
    4. 11.4 Receiving Notification of Documentation Updates
    5. 11.5 Community Resource
    6. 11.6 Trademarks
    7. 11.7 Electrostatic Discharge Caution
    8. 11.8 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.1.5 EMIRR +IN Test Configuration

Figure 59 shows the circuit configuration for testing the EMIRR IN+. An RF source connects to the op amp noninverting input pin using a transmission line. The op amp is configured in a unity-gain buffer topology with the output connected to a low-pass filter (LPF) and a digital multimeter (DMM). A large impedance mismatch at the op amp input causes a voltage reflection; however, this effect is characterized and accounted for when determining the EMIRR IN+. A multimeter samples and measures the resulting DC offset voltage. The LPF isolates the multimeter from residual RF signals that may interfere with multimeter accuracy.

OPA1692 EMIRR_Test_CKT_SBOS079.gifFigure 59. EMIRR +IN Test Configuration