SBOS377L October   2006  – January 2020 OPA211

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Input Voltage Noise Density vs Frequency
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions: OPA211
    2.     Pin Functions: OPA2211
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information: OPA211 and OPA211A
    5. 6.5 Thermal Information: OPA2211 and OPA2211A
    6. 6.6 Electrical Characteristics: Standard Grade OPAx211A
    7. 6.7 Electrical Characteristics: High-Grade OPAx211
    8. 6.8 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Total Harmonic Distortion Measurements
    4. 7.4 Device Functional Modes
      1. 7.4.1 Shutdown
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Operating Voltage
      2. 8.1.2 Input Protection
      3. 8.1.3 Noise Performance
      4. 8.1.4 Basic Noise Calculations
      5. 8.1.5 EMI Rejection
      6. 8.1.6 EMIRR +IN Test Configuration
      7. 8.1.7 Electrical Overstress
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 SON Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
        1. 11.1.1.1 TINA-TI™ (Free Software Download)
        2. 11.1.1.2 TI Precision Designs
        3. 11.1.1.3 WEBENCH® Filter Designer
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Related Links
    4. 11.4 Receiving Notification of Documentation Updates
    5. 11.5 Support Resources
    6. 11.6 Trademarks
    7. 11.7 Electrostatic Discharge Caution
    8. 11.8 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.1 Total Harmonic Distortion Measurements

OPA211 series operational amplifiers have excellent distortion characteristics. THD + noise is below 0.0001% (G = 1, VO = 3 VRMS) throughout the audio frequency range, 20 Hz to 20 kHz, with a 600-Ω load.

The distortion produced by OPAx211 series operational amplifiers is below the measurement limit of many commercially available distortion analyzers. However, a special test circuit shown in Figure 43 can extend the measurement capabilities.

Operational amplifier distortion can be considered an internal error source that can be referred to the input. Figure 43 shows a circuit that causes the operational amplifier distortion to be 101 times greater than that normally produced by the operational amplifier. The addition of R3 to the otherwise standard noninverting amplifier configuration alters the feedback factor or noise gain of the circuit. The closed-loop gain is unchanged, but the feedback available for error correction is reduced by a factor of 101, thus extending the resolution by 101.

NOTE

The input signal and load applied to the operational amplifier are the same as with conventional feedback without R3. The value of R3 should be kept small to minimize its effect on the distortion measurements.

Validity of this technique can be verified by duplicating measurements at high gain and/or high frequency where the distortion is within the measurement capability of the test equipment. Measurements for this data sheet were made with an Audio Precision System Two distortion/noise analyzer, which greatly simplifies such repetitive measurements. The measurement technique can, however, be performed with manual distortion measurement instruments.

OPA211 OPA2211 ai_noise_calc_bos377.gifFigure 42. Noise Calculation in Gain Configurations
OPA211 OPA2211 ai_dist_test_bos377k.pngFigure 43. Distortion Test Circuit