The L+ and CQ pins of the device are capable of withstanding up to 1.2 kV of 1.2/50 – 8/20 μs IEC 61000-4-5 surge with a source impedance of 500 Ω. The surge testing should be performed with a minimum 100 nF supply decoupling capacitor between L+ and L-, and 1 µF between VCC_IN/OUT and L-.
External TVS diodes may be required for higher transient protection levels. The system designer should ensure that the maximum clamping voltage of the external diodes should be < 65 V at the desired current level. The device is capable of withstanding up to ±65-V transient pulses < 100 µs.