SBOS551C march   2011  – april 2023 TLV3011-Q1 , TLV3011B-Q1 , TLV3012-Q1 , TLV3012B-Q1

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings TLV3012-Q1 DCK Package Only
    2. 6.2  Absolute Maximum Ratings - TLV301x-Q1 DBV Package, TLV3011B-Q1 and TLV3012B-Q1
    3. 6.3  ESD Ratings
    4. 6.4  Thermal Information - TLV3012-Q1 DCK Package Only
    5. 6.5  Thermal Information- TLV301x-Q1 DBV Package, TLV3011B-Q1 and TLV3012B-Q1
    6. 6.6  Recommended Operating Conditions
    7. 6.7  Electrical Characteristics - TLV3012-Q1 DCK Package Only
    8. 6.8  Switching Characteristics - TLV3012-Q1 DCK Package Only
    9. 6.9  Electrical Characteristics- TLV301x-Q1 DBV Package, TLV3011B-Q1 and TLV3012B-Q1
    10. 6.10 Switching Characteristics- TLV301x-Q1 DBV Package, TLV3011B-Q1 and TLV3012B-Q1
  7. Typical Characteristics - TLV3012-Q1 DCK Package Only
  8. Typical Characteristics - TLV301x-Q1 DBV Package, TLV3011B-Q1 and TLV3012B-Q1
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
    4. 9.4 Device Functional Modes
      1. 9.4.1 Open Drain Output (TLV3011-Q1 and TLV3011B-Q1)
      2. 9.4.2 Push-Pull Output (TLV3012-Q1 and TLV3012B-Q1)
      3. 9.4.3 Voltage Reference
      4. 9.4.4 TLV3011B-Q1 and TLV3012B-Q1 Fail-Safe inputs
      5. 9.4.5 TLV3011B-Q1 and TLV3012B-Q1 Power On Reset
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 External Hysteresis
      2. 10.1.2 TLV3011B-Q1 and TLV3012B-Q1 Hysteresis
    2. 10.2 Typical Application
      1. 10.2.1 Under-Voltage Detection
        1. 10.2.1.1 Design Requirements
        2. 10.2.1.2 Detailed Design Procedure
        3. 10.2.1.3 Application Curve
    3. 10.3 System Examples
      1. 10.3.1 Power-On Reset
      2. 10.3.2 Relaxation Oscillator
    4. 10.4 Power Supply Recommendations
    5. 10.5 Layout
      1. 10.5.1 Layout Guidelines
      2. 10.5.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Support Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.