SBOS820A September 2019 – June 2020 TMCS1100
The same compensation techniques utilized in the TMCS1100 to reduce temperature drift also greatly reduce lifetime drift due to aging, stress, and environmental conditions. Typical magnetic sensors suffer from up to 2% to 3% of sensitivity drift due to aging at high operating temperatures. The TMCS1100 has greatly improved lifetime drift, as defined in the Electrical Characteristics for total sensitivity error measured after the worst case stress test during a three lot AEC-Q100 qualification. All other stress tests prescribed by an AEC-Q100 qualification caused lower than the specified sensitivity error, and were within the bounds specified within the Electrical Characteristics table. Figure 38 shows the total sensitivity error after the worst case stress test, a Highly Accelerated Stress Test (HAST) at 130°C and 85% relative humidity (RH), while Figure 39 and Figure 40 show the sensitivity and offset error drift after a 1000 hour, 125°C high temperature operating life stress test as specified by AEC-Q100. This test mimics typical device lifetime operation, and shows the likely device performance variation due to aging is vastly improved compared to typical magnetic sensors.