SBOS473I March   2009  – December 2018 TMP112

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Block Diagram
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Feature Description
      1. 7.3.1 Digital Temperature Output
      2. 7.3.2 Serial Interface
        1. 7.3.2.1 Bus Overview
        2. 7.3.2.2 Serial Bus Address
        3. 7.3.2.3 Writing and Reading Operation
        4. 7.3.2.4 Slave Mode Operations
          1. 7.3.2.4.1 Slave Receiver Mode
          2. 7.3.2.4.2 Slave Transmitter Mode
        5. 7.3.2.5 SMBus Alert Function
        6. 7.3.2.6 General Call
        7. 7.3.2.7 High-Speed (Hs) Mode
        8. 7.3.2.8 Timeout Function
        9. 7.3.2.9 Timing Diagrams
          1. 7.3.2.9.1 Two-Wire Timing Diagrams
    4. 7.4 Device Functional Modes
      1. 7.4.1 Continuos-Conversion Mode
      2. 7.4.2 Extended Mode (EM)
      3. 7.4.3 One-Shot/Conversion Ready Mode (OS)
      4. 7.4.4 Thermostat Mode (TM)
        1. 7.4.4.1 Comparator Mode (TM = 0)
        2. 7.4.4.2 Interrupt Mode (TM = 1)
    5. 7.5 Programming
      1. 7.5.1 Pointer Register
      2. 7.5.2 Temperature Register
      3. 7.5.3 Configuration Register
        1. 7.5.3.1 Shutdown Mode (SD)
        2. 7.5.3.2 Thermostat Mode (TM)
        3. 7.5.3.3 Polarity (POL)
        4. 7.5.3.4 Fault Queue (F1/F0)
        5. 7.5.3.5 Converter Resolution (R1 and R0)
        6. 7.5.3.6 One-Shot (OS)
        7. 7.5.3.7 Extended Mode (EM)
        8. 7.5.3.8 Alert (AL)
      4. 7.5.4 High- and Low-Limit Register
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrical Characteristics

At TA = +25°C and VS = +1.4V to +3.6V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TEMPERATURE INPUT
Temperature range –40 +125 °C
Accuracy (temperature error) TMP112A +25°C, V+ = 3.3 V ±0.1 ±0.5 °C
0°C to +65°C, V+ = 3.3 V ±0.25 ±0.5
–40°C to +125°C ±0.5 ±1
TMP112B +25°C, V+ = 1.8 V ±0.1 ±0.5
0°C to +65°C, V+ = 1.8 V ±0.25 ±0.5
–40°C to +125°C ±0.5 ±1
TMP112N –40°C to +125°C ±1
DC power-supply sensitivity –40°C to +125°C 0.0625 ±0.25 °C/V
Long-term drift (1) 3000 hours at 125°C ±0.0625 °C
Resolution (LSB) 0.0625 °C
DIGITAL INPUT/OUTPUT
Input capacitance 3 pF
VIH Input logic level 0.7 (V+) 3.6 V
VIL –0.5 0.3 (V+)
IIN Input current 0 < VIN < 3.6 V 1 μA
VOL SDA Output logic level V+ > 2 V, IOL = 3 mA 0 0.4 V
V+ < 2 V, IOL = 3 mA 0 0.2 (V+)
VOL ALERT V+ > 2 V, IOL = 3 mA 0 0.4 V
V+ < 2 V, IOL = 3 mA 0 0.2 (V+)
Resolution 12 Bits
Conversion time 26 35 ms
Conversion modes CR1 = 0, CR0 = 0 0.25 Conv/s
CR1 = 0, CR0 = 1 1
CR1 = 1, CR0 = 0 (default) 4
CR1 = 1, CR0 = 1 8
Timeout time 30 40 ms
POWER SUPPLY
Operating supply range +1.4 +3.6 V
IQ Average quiescent current Serial bus inactive, CR1 = 1, CR0 = 0 (default) 7 10 μA
Serial bus active, SCL frequency = 400 kHz 15
Serial bus active, SCL frequency = 3.4 MHz 85
ISD Shutdown current Serial bus inactive 0.5 1 μA
Serial bus active, SCL frequency = 400 kHz 10
Serial bus active, SCL frequency = 3.4 MHz 80
Long-term drift is determined using accelerated operational life testing at a junction temperature of 150°C for 1000 hours.