Figure 5-2, Figure 5-3, and Figure 5-4 show a typical representation of the relationship between frequency and current consumption on the device. The operational test from Table 5-1 was run across frequency at VNOM and room temperature. Actual results will vary based on the system implementation and conditions.
Leakage current on the VDD core supply will increase with operating temperature in an exponential manner as seen in Figure 5-5. The current consumption in HALT mode is primarily leakage current as there is no active switching if the internal oscillator has been powered down.
Figure 5-5 shows the typical leakage current across temperature. The device was placed into HALT mode under nominal voltage conditions.