SLVSCM2D October 2014 – December 2019 TPS1H100-Q1
Short-circuit reliability is critical for smart high-side power switch devices. The AEC-Q100-012 standard is used to determine the reliability of the devices when operating in a continuous short-circuit condition. Different grade levels are specified according to the pass cycles. This device is qualified with the highest level, Grade A, 1 million times short-to-GND certification.
Three test modes are defined in the AEC Q100-012 standard. See Table 3 for cold repetitive short-circuit test – long pulse, cold repetitive short-circuit test – short pulse, and hot repetitive short-circuit test.
|Test Items||Test Condition||Test Cycles|
|Cold repetitive short-circuit test – short pulse||–40°C, 10-ms pulse, cool down||1M|
|Cold repetitive short-circuit test – long pulse||–40°C, 300-ms pulse, cool down||1M|
|Hot repetitive short-circuit test||25°C, continuous short||1M|
Different grade levels are specified according to the pass cycles. The TPS1H100-Q1 device gets the certification of Grade A level, 1 million short-to-GND cycles, which is the highest test standard in the market.
|Grade||Number of Cycles||Lots,Samples Per Lot||Number of Fails|
|B||>300000 to 1000000||3, 10||0|
|C||>100000 to 300000||3, 10||0|
|D||>30000 to 100000||3, 10||0|
|E||>10000 to 30000||3, 10||0|
|F||>3000 to 10000||3, 10||0|
|G||>1000 to 3000||3, 10||0|
|H||300 to 1000||3, 10||0|