SLVSE17A May 2019 – April 2020 TPS1HB16-Q1
The TPS1HB16-Q1 is tested according to the AEC-Q100-012 Short Circuit Reliability standard. This test is performed to demonstrate the robustness of the device against VOUT short-to-ground events. Test conditions and test procedures are summarized in Table 15. For further details, refer to the AEC-Q100-012 standard document.
The cold repetitive test is run at 85ºC which is the worst case condition for the device to sustain a short circuit. The cold repetitive test refers to the device being given time to cool down between pulses, rather than being run at a cold temperature. The load short circuit is the worst case situation, since the energy stored in the cable inductance can cause additional harm. The fast response of the device ensures current limiting occurs quickly and at a current close to the load short condition. In addition, the hot repetitive test is performed as well.
|TEST||LOCATION OF SHORT||DEVICE VERSION||NO. OF CYCLES / DURATION||NO. OF UNITS||NO. OF FAILS|
|Cold Repetitive - Long Pulse(1)||Load Short Circuit, Lshort = 5 μH, Rshort = 200 mΩ, TA = 85ºC||B||100 k cycles||30||0|
|Hot Repetitive - Long Pulse||Load Short Circuit, Lshort = 5 μH, Rshort = 100 mΩ, TA = 25ºC||B||100 hours||30||0|