II is fixed for measuring VCE(sat), variable for measuring hFE.
Figure 13. hFE, VCE(sat) Test Circuit
Figure 10. ICEX Test Circuit
Figure 12. II Test Circuit
Figure 14. VI(on) Test Circuit
Figure 15. IR Test Circuit
Figure 16. VF Test Circuit
Figure 17. Propagation Delay-Time Waveforms
The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω.
CL includes probe and jig capacitance.
For testing the ULN2003A device, ULN2003AI device, and ULQ2003A devices, VIH = 3 V; for the ULN2002A device, VIH = 13 V; for the ULN2004A and the ULQ2004A devices, VIH = 8 V.
Figure 18. Latch-Up Test Circuit and Voltage Waveforms