SLVSCV5D March   2015  – October 2016 ATL431 , ATL432

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics, ATL431Ax, ATL432Ax
    6. 6.6 Electrical Characteristics, ATL431Bx, ATL432Bx
    7. 6.7 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Open Loop (Comparator)
      2. 8.4.2 Closed Loop
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Comparator With Integrated Reference (Open Loop)
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Basic Operation
          2. 9.2.1.2.2 Overdrive
          3. 9.2.1.2.3 Output Voltage and Logic Input Level
            1. 9.2.1.2.3.1 Input Resistance
        3. 9.2.1.3 Application Curve
      2. 9.2.2 Shunt Regulator/Reference
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
          1. 9.2.2.2.1 Programming Output/Cathode Voltage
          2. 9.2.2.2.2 Total Accuracy
          3. 9.2.2.2.3 Stability
        3. 9.2.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7 Parameter Measurement Information

The deviation parameters Vref(dev) and Iref(dev) are defined as the differences between the maximum and minimum values obtained over the rated temperature range. The average full-range temperature coefficient of the reference input voltage αVref is defined as:
ATL431 ATL432 note_aviref_lvs543.gif
αVref is positive or negative, depending on whether minimum Vref or maximum Vref, respectively, occurs at the lower temperature.

The dynamic impedance is defined as: ATL431 ATL432 eq_def_zka.gif
When the device is operating with two external resistors (see Figure 23), the total dynamic impedance of the circuit is given by: ATL431 ATL432 eq_zprm.gif which is approximately equal to ATL431 ATL432 eq_zprm_app_eq.gif

ATL431 ATL432 pmi_vka_eq_vref_lvs543.gif Figure 22. Test Circuit for VKA = Vref
ATL431 ATL432 pmi_ioff_lvs543.gif
Figure 24. Test Circuit for Ioff
ATL431 ATL432 TC_outZ.gif
Figure 26. Test Circuit for Reference Impedance (ZKA)
ATL431 ATL432 pulseTest.gif Figure 28. Test Circuit for Pulse Response
ATL431 ATL432 pmi_vka_gt_vref_lvs543.gif Figure 23. Test Circuit for VKA > Vref
ATL431 ATL432 TC_PG-CustomCF.gif
Figure 25. Test Circuit for Phase and Gain Measurement
ATL431 ATL432 TC_stabilityG1.gif Figure 27. Test Circuit for Stability Boundary Conditions