SLVSCV5D March   2015  – October 2016 ATL431 , ATL432

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics, ATL431Ax, ATL432Ax
    6. 6.6 Electrical Characteristics, ATL431Bx, ATL432Bx
    7. 6.7 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Open Loop (Comparator)
      2. 8.4.2 Closed Loop
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Comparator With Integrated Reference (Open Loop)
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Basic Operation
          2. 9.2.1.2.2 Overdrive
          3. 9.2.1.2.3 Output Voltage and Logic Input Level
            1. 9.2.1.2.3.1 Input Resistance
        3. 9.2.1.3 Application Curve
      2. 9.2.2 Shunt Regulator/Reference
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
          1. 9.2.2.2.1 Programming Output/Cathode Voltage
          2. 9.2.2.2.2 Total Accuracy
          3. 9.2.2.2.3 Stability
        3. 9.2.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Specifications

Absolute Maximum Ratings(1)

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VKA Cathode voltage(2) 40 V
IKA Continuous cathode current –100 150 mA
II(ref) Reference input current –0.05 10 mA
TJ Operating virtual junction temperature –40 150 °C
Tstg Storage temperature –65 150 °C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to ANODE, unless otherwise noted.

ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±1000
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

Recommended Operating Conditions

MIN MAX UNIT
VKA Cathode voltage Vref 36 V
IKA Cathode current .035 100 mA
TA Operating free-air temperature "I" Grade –40 85 °C
"Q" Grade –40 125

Thermal Information

THERMAL METRIC(1) ATL43xx UNIT
DBZ (SOT-23)
3 PINS
RθJA Junction-to-ambient thermal resistance 331.8 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 106.5 °C/W
RθJB Junction-to-board thermal resistance 64.6 °C/W
ψJT Junction-to-top characterization parameter 4.9 °C/W
ψJB Junction-to-board characterization parameter 62.9 °C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.

Electrical Characteristics, ATL431Ax, ATL432Ax

over recommended operating conditions, TA = 25°C (unless otherwise noted)
PARAMETER TEST CIRCUIT TEST CONDITIONS MIN TYP MAX UNIT
Vref Reference voltage Figure 22 VKA = Vref, IKA = 1 mA 2475 2500 2525 mV
VI(dev) Deviation of reference input voltage over full temperature range, see section Figure 22 VKA = Vref,
IKA = 1 mA,
ATL43xAI; TA =
-40°C to 85°C
5 15 mV
ATL43xAQ; TA =
-40°C to 125°C
6 34
ΔVref / ΔVKA Ratio of change in reference voltage to the change in cathode voltage Figure 23 IKA = 1 mA ΔVKA = 10 V − Vref –0.4 –2.7 mV/V
ΔVKA = 36 V − 10 V –0.1 –2
Iref Reference input current Figure 23 IKA = 1 mA, R1 = 10 kΩ, R2 = ∞ 30 150 nA
II(dev) Deviation of reference input current over full temperature range, see section Figure 23 IKA = 1 mA, R1 = 10 kΩ, R2 = ∞ 20 50 nA
Imin Minimum cathode current for regulation Figure 22
Figure 5
VKA = Vref 20 35 µA
Ioff Off-state cathode current Figure 24 VKA = 36 V, Vref = 0 0.05 0.2 µA
|zKA| Dynamic impedance, see section Figure 22 VKA = Vref, f ≤ 1 kHz, IKA = 1 mA to 100 mA 0.05 0.3 Ω

Electrical Characteristics, ATL431Bx, ATL432Bx

over recommended operating conditions, TA = 25°C (unless otherwise noted)
PARAMETER TEST CIRCUIT TEST CONDITIONS MIN TYP MAX UNIT
Vref Reference voltage Figure 22 VKA = Vref, IKA = 1 mA 2487 2500 2512 mV
VI(dev) Deviation of reference input voltage over full temperature range, see section Figure 22 VKA = Vref, IKA = 1 mA ATL43xBI; TA =
–40°C to 85°C
5 15 mV
ATL43xBQ; TA =
–40°C to 125°C
6 34
ΔVref / ΔVKA Ratio of change in reference voltage to the change in cathode voltage Figure 23 IKA = 1 mA ΔVKA = 10 V − Vref –0.4 –2.7 mV/V
ΔVKA = 36 V − 10 V –0.1 –2
Iref Reference input current Figure 23 IKA = 1 mA, R1 = 10 kΩ, R2 = ∞ 30 150 nA
II(dev) Deviation of reference input current over full temperature range, see section Figure 23 IKA = 1 mA, R1 = 10 kΩ, R2 = ∞ 20 50 nA
Imin Minimum cathode current for regulation Figure 22
Figure 5
VKA = Vref 20 35 µA
Ioff Off-state cathode current Figure 24 VKA = 36 V, Vref = 0 0.05 0.2 µA
|zKA| Dynamic impedance, see section Figure 22 VKA = Vref, f ≤ 1 kHz, IKA = 1 mA to 100 mA 0.05 0.3 Ω

Typical Characteristics

Data at high and low temperatures are applicable only within the recommended operating free-air temperature ranges of the various devices.
ATL431 ATL432 vref_vs_temp.gif
IKA=1mA
Figure 1. Reference Voltage vs Free-Air Temperature
ATL431 ATL432 vref_Ik.gif
Figure 3. Cathode Current vs Cathode Voltage
ATL431 ATL432 vref_ikzoom.gif
Figure 5. Cathode Current vs Cathode Voltage
ATL431 ATL432 dVref.gif
IKA=1mA
Figure 7. Delta Reference Voltage vs Cathode Voltage
ATL431 ATL432 Vnoise.gif
IKA = 1 mA
Figure 9. Noise Voltage
ATL431 ATL432 outZ.gif
Figure 26 used for this measurement.
Figure 11. Output Impedance vs Frequency
ATL431 ATL432 pulse100ua.gif
IKA = 100 µA Figure 28 used for this measurement.
Figure 13. Pulse Response
ATL431 ATL432 low5_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 15. Low IKA (VKA = 5.0 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 low15_region.gif
ESR < 20mΩ Figure 27 used to verify stability.
Figure 17. Low IKA (VKA = 15.0 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 high5_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 19. High IKA (VKA = 5.0 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 high15_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 21. High IKA (VKA = 15.0 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 irefVStemp.gif
Figure 2. Reference Current vs Free-Air Temperature
ATL431 ATL432 vref_lowIk.gif
Figure 4. Cathode Current vs Cathode Voltage
ATL431 ATL432 Ioff.gif
Figure 6. Off-State Cathode Current vs Free-Air Temperature
ATL431 ATL432 dVref_temp.gif
IKA=1mA
Figure 8. Delta Reference Voltage vs Cathode Voltage
ATL431 ATL432 GainPhase-CustomCF.png
Figure 25 used for this measurement. IKA=1mA
Figure 10. Small-Signal Voltage Amplification vs Frequency
ATL431 ATL432 outZ_temp.gif
Figure 26 used for this measurement.
Figure 12. DC Output Impedance vs Temperature
ATL431 ATL432 low2p5_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 14. Low IKA (VKA = 2.5 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 low10_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 16. Low IKA (VKA = 10.0 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 high2p5_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 18. High IKA (VKA = 2.5 V) Stability Boundary Conditions all ATL43xx Devices
ATL431 ATL432 high10_region.gif
ESR < 20 mΩ Figure 27 used to verify stability.
Figure 20. High IKA (VKA = 10.0 V) Stability Boundary Conditions all ATL43xx Devices