JAJSFP5E July   2018  – February 2022 REF2025 , REF2030 , REF2033 , REF2041

PRODUCTION DATA  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Solder Heat Shift
    2. 8.2 Long-Term Stability
    3. 8.3 Thermal Hysteresis
    4. 8.4 Noise Performance
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 VREF and VBIAS Tracking
      2. 9.3.2 Low Temperature Drift
      3. 9.3.3 Load Current
    4. 9.4 Device Functional Modes
  10. 10Applications and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Low-Side, Current-Sensing Application
        1. 10.2.1.1 Design Requirements
        2. 10.2.1.2 Detailed Design Procedure
          1. 10.2.1.2.1 Shunt Resistor
          2. 10.2.1.2.2 Differential Amplifier
          3. 10.2.1.2.3 Voltage Reference
          4. 10.2.1.2.4 Results
        3. 10.2.1.3 Application Curves
  11. 11Power-Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 サポート・リソース
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

4 Revision History

Changes from Revision D (May 2018) to Revision E (January 2022)

  • 誤ってタイトルに付けられた -Q1 を削除。SBOS600E を上書きしてエラーを修正。Go
  • 「アプリケーション」セクションを更新Go
  • 文書全体にわたって表、図、相互参照の採番方法を更新Go
  • Changed ESD Rating table: changed HBM rating from ±4000 V to ±2500 VGo
  • Updated Long-term stability valueGo
  • Added Long-Term Stability sub-section under Parameter Measurement Information sectionGo

Changes from Revision C (January 2017) to Revision D (May 2018)

  • Changed application information to include corrosion resistance advantages. Go

Changes from Revision B (July 2014) to Revision C (January 2017)

  • Added I/O column to Pin Functions table Go
  • Added Storage temperature parameter to Absolute Maximum Ratings table (moved from ESD Ratings table)Go
  • Changed ESD Rating table: changed title, updated table format Go

Changes from Revision A (June 2014) to Revision B (July 2014)

  • デバイス・ステータスを「事前情報」から「量産データ」に変更Go
  • 「製品情報」表から脚注 2 を削除Go
  • Deleted footnote from Device Comparison Table Go
  • Added Thermal Information tableGo

Changes from Revision * (May 2014) to Revision A (June 2014)

  • 製品プレビューのデータシートを変更Go