This document contains information for TIOL112(x) family of devices (TIOL112, TIOL1123 and TIOL1125) to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
Figure 1-1 and Figure 1-2 show the device functional block diagram for reference.
Figure 1-1 Functional Block Diagram (TIOL112)
Figure 1-2 Functional Block Diagram (TIOL1123, TIOL1125)
The devices were developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.