SLUA963B June   2020  – October 2022 UCC21710-Q1 , UCC21732-Q1 , UCC5870-Q1

 

  1.   HEV/EV Traction Inverter Design Guide Using Isolated IGBT and SiC Gate Drivers
  2. 1Introduction
  3. 2HEV/EV Overview
    1. 2.1 HEV/EV Architectures
    2. 2.2 HEV/EV Traction Inverter System Architecture
    3. 2.3 HEV/EV Traction Inverter System Performance Impact
  4. 3Design of HEV/EV Traction Inverter Drive Stage
    1. 3.1  Introduction to UCC217xx-Q1
    2. 3.2  Designing a Traction Inverter Drive System Using UCC217xx-Q1
    3. 3.3  Description of Protection Features
    4. 3.4  Protection Features of UCC217xx-Q1
    5. 3.5  UCC217xx-Q1 Protection and Monitoring Features Descriptions
      1. 3.5.1 Primary and Secondary Side UVLO and OVLO
      2. 3.5.2 Over-Current (OC) and Desaturation (DESAT) Detection
      3. 3.5.3 2-Level and Soft Turn-Off
      4. 3.5.4 Power Switch Gate Voltage (VGE/VGS) Monitoring
      5. 3.5.5 Power Switch Anti-Shoot-Through
      6. 3.5.6 Integrated Internal or External Miller Clamp
      7. 3.5.7 Isolated Analog-to-PWM Channel
      8. 3.5.8 Short-Circuit Clamping
      9. 3.5.9 Active Pulldown
    6. 3.6  Introduction to UCC5870-Q1
    7. 3.7  Designing a Traction Inverter Drive System Using UCC5870-Q1
    8. 3.8  Description of Protection Features
    9. 3.9  Protection Features of UCC5870-Q1
    10. 3.10 UCC5870-Q1 Protection and Monitoring Features Descriptions
      1. 3.10.1  Primary and Secondary Side UVLO and OVLO
      2. 3.10.2  Programmable Desaturation (DESAT) Detection and Over-Current (OC)
      3. 3.10.3  Adjustable 2-Level or Soft Turn-Off
      4. 3.10.4  Active High-Voltage Clamp
      5. 3.10.5  Power Switch Gate Voltage (VGE/VGS) Monitoring
      6. 3.10.6  Gate Threshold Voltage Monitor
      7. 3.10.7  Power Switch Anti-Shoot-Through
      8. 3.10.8  Active Short Circuit (ASC)
      9. 3.10.9  Integrated Internal or External Miller Clamp
      10. 3.10.10 Isolated Analog-to-Digital Converter
        1. 3.10.10.1 Temperature Monitoring of Power Transistor
      11. 3.10.11 Short-Circuit Clamping
      12. 3.10.12 Active and Passive Pulldown
      13. 3.10.13 Thermal Shutdown and Temperature Warning of Driver IC
      14. 3.10.14 Clock Monitor and CRC
      15. 3.10.15 SPI and Register Data Protection
  5. 4Isolated Bias Supply Architecture
  6. 5Summary
  7. 6References
  8. 7Revision History

HEV/EV Traction Inverter System Performance Impact

The failure modes must all be considered throughout the traction inverter's design and implementation to ensure safe and efficient operation. Some mechanical or electronics failures that can impact the motor's performance related to the inverter system are shown in Table 2-2. Causes such as a motor short or open due to mechanical failure will not be discussed in this application note. Those failures that occur from the vantage point of the power electronics' will be discussed in more detail and the prevention mechanisms outlined in this section.

Table 2-2 Traction Inverter System Event Examples
TRACTION INVERTER SYSTEM IMPACTMECHANICAL CAUSEELECTRONICS CAUSEPREVENTION MECHANISM
Under torqueCoil short or openIGBT short or openIGBT protection
Gate driver damagedSelf-test and diagnostics
Gate driver output latched
Gate driver incorrect logic
Isolation Failure
MCU failureMCU watchdog
PMIC failurePMIC monitor
Sensor failureRedundant sensing
Over torqueN/AMCU failureMCU watchdog
Sensor failureRedundant sensing
Unintended motor commutationN/AMCU failureMCU watchdog
Unintended motor shutdown / no outputCoil short or openIGBT short or openIGBT protection
DC bus failureVoltage monitor
MCU failureMCU watchdog
PMIC failurePMIC monitor

The voltage applied to the three windings of the motor, as previously discussed, determine the speed and torque of the motor. Disturbances can occur due to a variety of events. The power switching devices in the inverter, referred to as the IGBTs from this point on, may become shorted or open due to a mechanical failure, over-heating, etc. The gate driver itself could be a source for failure if it is damaged due to over-temperature or mechanical reasons, has a latched output, receives an incorrect signal from the MCU, or has experienced isolation barrier failure. To cover a variety of potential failures, the gate driver and auxiliary circuits are used to monitor the power switch for short circuit, proper gate voltage and other signals to protect the IGBTs and gate drivers. Additionally, circuitry is included to perform self-tests on critical functions in the case of a latent failure which occurs after a cycle of operation. Aside from the gate driver circuits, the MCU or PMIC should also have redundant monitoring circuits to prevent controller failure or supply failure.

The following sections introduce the UCC217xx-Q1 and the UCC5870-Q1 drivers, their integrated protection and diagnostic functions, and how they simplify the design of the traction inverter system. External circuits are also described, when necessary, to assist in performing self-tests and diagnostics.