SLUUCX0A February 2024 – June 2024 UCC57108
| Pins | Description |
|---|---|
| VCC | Vcc positive supply test point. Powers IC VDD pin. |
| VDD | VDD positive supply of UCC57108 IC |
| VEE | VEE negative supply of UCC57108 IC. Used only for UCC57108B variant. |
VREF | VREF test point. Used only for UCC57108B and UCC57108C variants. |
| VBUS | VBUS positive supply test point. Bus voltage for external power device. |
| GND | Multiple test points. Ground at UCC57108 IC. |
| IN_IN | Input signal test point. Powers IC IN pin. |
| IN | Signal input of UCC57108 IC. |
| EN_IN | Enable signal test point. Powers IC EN pin. Used only for UCC57108W variant. |
| EN | Enable of UCC57108 IC. Used only for UCC57108W variant. |
| DESAT | DESAT input of UCC57108 IC. |
| FLT | Fault output of UCC57108 IC. |
| Gate | Gate test point of UCC57108 IC. Connected to 1nF capacitor and gate of external FET. |
| OUT/OUTH | Output pin of UCC57108 IC before external gate resistor. OUTH is used only for UCC57108C variant. |
| OUTL | Low output pin for UCC57108. Used only for UCC57108C variant. |
| Drain | Drain test point for external FET. |