SNLA389A December   2021  – May 2022 DP83TC812R-Q1 , DP83TC812S-Q1 , DP83TC813R-Q1 , DP83TC813S-Q1 , DP83TC814R-Q1 , DP83TC814S-Q1

 

  1.   Trademarks
  2. 1Introduction
  3. 2Hardware Configuration
    1. 2.1 Schematic
  4. 3Software Configuration
  5. 4Testing PMA
    1. 4.1 PMA Testing Procedure
  6. 5Testing IOP: Link-up and Link-down
    1. 5.1 IOP Testing Procedure
  7. 6Testing SQI
    1. 6.1 SQI Value Interpretation
  8. 7Testing TDR
    1. 7.1 TDR Testing Procedure
  9. 8Testing EMC and EMI
  10. 9Revision History

Revision History

Changes from Revision * (December 2021) to Revision A (May 2022)

  • Added support for DP83TC813, DP83TC814 devices throughout the document.Go
  • Added description of ESD component to Table 2-1. Added optional notice for VDDA decoupling capacitor. Updated ferrite bead recommendation for VDDIO or VDDMAC. Added footnote for VDDIO and VDDMAC ferrite bead. Modified figures to include pertinent information relating to DP83TC813 and DP83TC814.Go
  • Added Figure 2-2, Figure 2-3, Figure 2-6 figures.Go
  • Updated Test Mode 4 command for DP83TC813Go