SBAA436 March   2021 REF34-Q1 , REF3425 , REF3425-EP , REF3430 , REF3430-EP , REF3433 , REF3433-EP , REF3440 , REF3440-EP , REF3450 , REF4132 , REF4132-Q1 , REF5010 , REF5020 , REF5020-EP , REF5020A-Q1 , REF5025 , REF5025-EP , REF5025-HT , REF5025A-Q1 , REF5030 , REF5030A-Q1 , REF5040 , REF5040-EP , REF5040A-Q1 , REF5045 , REF5045A-Q1 , REF5050 , REF5050-EP , REF5050A-Q1 , REF6125 , REF6133 , REF6141 , REF6145 , REF6150 , REF6225 , REF6230 , REF6233 , REF6241 , REF6245 , REF6250 , REF70

 

  1.   Long-Term Drift in Voltage References
  2.   Trademarks
  3. 1Long-Term Drift
  4. 2Long-Term Drift Data Sheet Measurement
  5. 3Long-Term Drift Error
  6. 4Package and Mold Compound Stress
  7. 5Test Setup
  8. 6Temperature Effect
  9. 7Long-Term Drift Estimation
  10. 8Methods to Minimize LTD Impact
  11. 9Reference

8 Methods to Minimize LTD Impact

The impact of LTD on a system can be minimized by the following:

  • Bake the device in power on condition before calibrating to remove the large deviation that occurs in the initial hours.
  • If high precision is required, it is recommended to have routine calibration.
  • If routine calibration is not possible, delay the 1st time calibration as late as possible to let the device age. Preferably just before installation or commissioning in the field.