SETs are defined as heavy-ion-induced transient upsets on output pin Q _Aof the SN54SC8T595-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was ¹²⁹Xe for a LET_EFF = 50MeV × cm² / mg. Flux of approximately 10⁵ ions / cm² × s and a fluence of approximately 10⁷ ions / cm² were used for the SET runs.

Three units were tested across multiple input conditions to determine the worst-case setup for SETs. The unit was tested with V_CC of 1.2V, 3.3V and 5.5V and a rising edge window trigger of ±1% and ±5%. The 1.2V V _CC combination with ±1% trigger saw a single transient upset. The 3.3V and 5.5V combinations of V_CC and window triggers showed no transient upsets, as listed in Table 5-2

To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin Q_A. The NI scope was programmed to a sample rate of 100M samples per second (S/s) and recorded 10k samples, with a 20% pretrigger reference, in case of an event (trigger). Under heavy-ions, the SN54SC8T595-SEP only saw a transient at the harshest condition of 1.2V V_CC and ±1% (Run 21). Figure 5-4 shows the SET observed.

Figure 5-4 SET on Run 21 (1.2V V_CC and ±1%)