SFFS146 November   2021 TCAN11623-Q1 , TCAN11625-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TCAN11623-Q1 DMT Package
    2. 2.2 TCAN11625-Q1 DMT Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TCAN11623-Q1 DMT Package
    2. 4.2 TCAN11625-Q1 DMT Package

1 Overview

This document contains information for TCAN11623-Q1 and TCAN11625-Q1 (DTM package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 and Figure 1-2 shows the device functional block diagram for reference.

WUP = Wake-up pattern
Figure 1-1 Functional Block Diagram (TCAN11623-Q1)
WUP = Wake-up pattern
Figure 1-2 Functional Block Diagram (TCAN11625-Q1)

The TCAN11623-Q1 and TCAN11625-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.