SFFS530 November 2022 TPSF12C1
This section provides a Failure Mode Analysis (FMA) for the pins of the TPSF12C1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPSF12C1 pin diagram. For a detailed description of the device pins, please refer to the Pin Configuration and Functions section in the TPSF12C1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No impact | D |
| VDD | 2 | AEF disabled | B |
| SENSE1A | 4 | AEF degradation | B |
| SENSE1B | 5 | AEF degradation | B |
| SENSE2A | 6 | AEF degradation | B |
| SENSE2B | 7 | AEF degradation | B |
| EN | 8 | AEF disabled | B |
| REFGND | 9 | Normal operation | D |
| COMP1 | 10 | No EMI filtering | B |
| COMP2 | 11 | No EMI filtering; damage to gain stage | A |
| INJ | 13 | No EMI filtering; damage to gain stage | A |
| IGND | 14 | Normal operation | D |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No effect (normal operation) | D |
| VDD | 2 | No EMI filtering | B |
| SENSE1A | 4 | AEF degradation | B |
| SENSE1B | 5 | AEF degradation | B |
| SENSE2A | 6 | AEF degradation | B |
| SENSE2B | 7 | AEF degradation | B |
| EN | 8 | No effect (normal operation) | B |
| REFGND | 9 | AEF degradation | B |
| COMP1 | 10 | No EMI filtering | B |
| COMP2 | 11 | No EMI filtering | B |
| INJ | 13 | No EMI filtering | B |
| IGND | 14 | AEF degradation | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| NC | 1 | VDD | No effect (normal operation) | D |
| VDD | 2 | NC | No effect (normal operation) | D |
| NC | 3 | SENSE1 | No effect (normal operation) | B |
| SENSE1A | 4 | SENSE1B | No effect (normal operation) | B |
| SENSE1B | 5 | SENSE2A | AEF degradation | B |
| SENSE2A | 6 | SENSE2B | No effect (normal operation) | B |
| SENSE2B | 7 | EN | N/A | D |
| EN | 8 | REFGND | No EMI filtering | B |
| REFGND | 9 | COMP1 | No EMI filtering | B |
| COMP1 | 10 | COMP2 | No EMI filtering | B |
| COMP2 | 11 | NC | No effect (normal operation) | D |
| NC | 12 | INJ | No effect (normal operation) | D |
| INJ | 13 | IGND | No EMI filtering; damage to gain stage | A |
| IGND | 14 | NC | No effect (normal operation) | D |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No effect (normal operation) | D |
| VDD | 2 | No effect (normal operation) | D |
| SENSE1A | 4 | AEF degradation; damage to sensing stage | A |
| SENSE1B | 5 | AEF degradation; damage to sensing stage | A |
| SENSE2A | 6 | AEF degradation; damage to sensing stage | A |
| SENSE2B | 7 | AEF degradation; damage to sensing stage | A |
| EN | 8 | AEF normal | B |
| REFGND | 9 | AEF disabled | B |
| COMP1 | 10 | No EMI filtering; damage to COMP1 if VVDD > 5.5 V | A |
| COMP2 | 11 | No EMI filtering; damage to COMP2 if VVDD > 15 V | A |
| INJ | 13 | No EMI filtering; damage to gain stage | A |
| IGND | 14 | AEF disabled | B |